Automated DSD Tester with Dynamic Test Sequencing
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Solution Overview
Problem
Existing data storage device (DSD) testing methods, such as drive self tests, are inadequate for accurately detecting defects, leading to defective DSDs being installed in OEM products, resulting in costly field failures and unnecessary returns.
Innovation Solution
A DSD tester with control circuitry that executes comprehensive tests, aggregates failure data with production line data, and correlates it to identify and correct manufacturing or production line issues, using a graphical user interface and barcode readers to manage the testing process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If drive self test (DST) is used for testing, then testing speed is improved, but measurement precision deteriorates leading to inaccurate defect detection
Solution Approach 1:
The system performs preliminary actions by collecting production line data and failure data before conducting comprehensive tests. This allows the system to pre-identify potential defect patterns and prepare appropriate test sequences, thereby maintaining high testing speed while improving defect detection accuracy through targeted testing based on preliminary findings.
Solution Approach 2:
The testing system dynamically adapts its approach by switching between different test types (comprehensive tests, targeted tests based on failure data) based on the specific situation. When defects are suspected, the system intensifies testing with comprehensive sequences; when no issues are present, it uses faster targeted tests, thus optimizing both speed and precision dynamically.
2Measurement precision
If comprehensive tests are performed to improve defect detection accuracy, then measurement precision is improved, but productivity deteriorates due to increased testing time
Solution Approach 1:
The testing process is segmented into different types: comprehensive tests for thorough defect detection and faster targeted tests for routine checking. The system divides testing into phases (production line data collection, failure data analysis, targeted testing) and applies appropriate test intensity to each segment, maintaining high productivity while ensuring accurate defect detection where needed.
Solution Approach 2:
The system applies partial testing (targeted tests) for routine scenarios where comprehensive testing is not necessary, and excessive action (comprehensive tests) only when defect detection is critical. This selective approach ensures high defect detection accuracy for problematic units while maintaining overall productivity through efficient partial testing for normal units.
3Loss of information
If production line data is collected and correlated with failure data, then loss of information is reduced, but device complexity increases
Solution Approach 1:
The control circuitry is designed with multi-functionality, serving both as a simple test executor and as a complex data aggregation and analysis system. This universal component handles multiple tasks (testing, data collection, correlation analysis) within a single integrated system, reducing overall device complexity while maintaining complete information tracking capabilities.
Solution Approach 2:
The system performs self-service by automatically collecting production line data, analyzing failure patterns, and generating test sequences without external intervention. This self-service capability reduces the need for complex external data management systems while ensuring complete information is captured and utilized for improved defect detection.
Data Source
AI summary
A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises a plurality of bays, a screen, and control circuitry operable to detect when a first DSD has been inserted into a first bay. Independent of operator input, a graphical user interface (GUI) displayed on the screen is automatically updated to reflect the first DSD has been inserted into the first bay. Independent of operator input, a DSD test is automatically executed on the first DSD. When the first DSD is removed from the first bay, independent of operator input, the GUI is automatically updated to reflect the first DSD has been removed from the first bay.