Automated Electronic Device Testing System With Probe Array

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Solution Overview

Problem

Manual testing of electronic devices is tedious, time-consuming, and prone to human errors due to the need for repetitive movement and manual operation, resulting in low-accuracy test results.

Innovation Solution

A testing system comprising a main controller, signal generator, instrument unit, and testing port with probes that automates the testing process by generating and processing test signals, allowing for automated connection and data processing without manual intervention.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual testing is performed with repetitive movement of electronic device, then testing can be conducted using simple tools, but testing time is excessive and accuracy is low due to human errors

Engineering Contradiction:
Improvetest result accuracyVSAvoidtesting time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces manual mechanical operations with an automated testing system comprising a main controller, signal generator, instrument unit, and switching unit. The main controller automatically controls signal generation, switching between testing points, and data processing, eliminating repetitive manual movement and human error while significantly reducing testing time

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The testing system performs self-testing through automated control where the main controller autonomously manages the entire testing process including signal generation, switching operations, and result computation without requiring manual intervention, thereby improving both efficiency and accuracy

Inventive Principle:
Principle #25Self-service

2Ease of operation

If manual testing is performed, then device complexity is low with simple testing tools, but ease of operation is poor due to tedious repetitive movements

Engineering Contradiction:
Improvetesting operation easeVSAvoidtesting system complexity
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The patent replaces tedious manual mechanical operations with an automated control system that manages signal generation, switching, and data processing automatically. Although this increases system complexity, it dramatically improves ease of operation by eliminating repetitive manual movements and human error

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The main controller serves multiple functions including controlling the signal generator, managing the switching unit, processing instrument data, and computing test results. This multi-functionality consolidates complex operations into a single automated system that is easier to operate despite increased internal complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS7609081B2Testing system and method for testing an electronic device
Publication Date: 2009.10.27 HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
  • US7609081B2 patent drawing
  • US7609081B2 patent drawing
  • US7609081B2 patent drawing

AI summary

A testing system for measuring an electronic device includes a main controller for generating a control signal, a signal generator for outputting a predetermined test input signal according to the control signal, an instrument unit having a plurality of instruments, and a testing port having a plurality of probes. The plurality of probes connects corresponding testing points of the electronic device to the signal generator and the instruments. The predetermined test input signal is transmitted to the electronic device via the testing port. The instrument unit processes a test result signal outputted by the electronic device and outputs a result data. The main controller receives the result data and computes whether the result data is within a predetermined range. A related testing method is also provided.