Automated Event Log Generation for Device Under Test
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Solution Overview
Problem
Current testing methods for electronic devices require manual evaluation of diverse types of devices, leading to high costs and long durations due to the need for separate testing procedures for each type, which lacks efficiency and automation.
Innovation Solution
A method for generating an event log through test routines that captures multimedia data, identifies key frames, and synchronizes them with test results, enabling automatic data reduction and analysis, thus allowing for automated testing across different device types.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual evaluation of message logs is performed for each device type, then test accuracy is improved, but testing duration and costs increase significantly
Solution Approach 1:
The patent creates a standardized test template that can be copied and applied across different device types. Instead of manually evaluating each device type separately, the same test routine and evaluation criteria are replicated for multiple devices, maintaining consistency and accuracy while reducing time consumption.
Solution Approach 2:
The test system is designed with universal applicability, where a single test template can evaluate multiple device types simultaneously. The message log evaluation mechanism is made multi-functional to handle different devices without requiring separate manual evaluation procedures for each type.
2Reliability
If separate test procedures are developed for each device type, then test reliability is improved, but device complexity and costs increase
Solution Approach 1:
A universal test template is created that can reliably evaluate multiple device types through a single standardized procedure. This eliminates the need for separate complex test procedures for each device type while maintaining test reliability through consistent evaluation criteria.
Solution Approach 2:
The test procedure is segmented into standardized, modular components that can be systematically applied to different device types. This segmentation allows for reliable testing across devices without requiring complex customized procedures for each type.
3Loss of information
If comprehensive message log analysis is performed manually, then information completeness is improved, but productivity decreases
Solution Approach 1:
The standardized test template copies proven evaluation methods that ensure comprehensive information capture. This replication of effective evaluation techniques maintains information completeness while automating the process to improve productivity.
Solution Approach 2:
The system enables automated self-evaluation of message logs through standardized templates, reducing the need for manual analysis while maintaining comprehensive information capture. The standardized approach allows the system to serve itself in evaluating test results efficiently.
Data Source
AI summary
A method for generating an event log in view of at least one test routine for a device under test, a logging system for logging at least one event frame for a device under test, a method for training a machine learning circuit to extract event frames from multimedia data, and a method for extracting event frames from multimedia data using a machine learning circuit trained are described.


