Automated Event Log Generation for Device Under Test

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Solution Overview

Problem

Current testing methods for electronic devices require manual evaluation of diverse types of devices, leading to high costs and long durations due to the need for separate testing procedures for each type, which lacks efficiency and automation.

Innovation Solution

A method for generating an event log through test routines that captures multimedia data, identifies key frames, and synchronizes them with test results, enabling automatic data reduction and analysis, thus allowing for automated testing across different device types.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual evaluation of message logs is performed for each device type, then test accuracy is improved, but testing duration and costs increase significantly

Engineering Contradiction:
Improvetest accuracyVSAvoidtesting duration
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent creates a standardized test template that can be copied and applied across different device types. Instead of manually evaluating each device type separately, the same test routine and evaluation criteria are replicated for multiple devices, maintaining consistency and accuracy while reducing time consumption.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The test system is designed with universal applicability, where a single test template can evaluate multiple device types simultaneously. The message log evaluation mechanism is made multi-functional to handle different devices without requiring separate manual evaluation procedures for each type.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If separate test procedures are developed for each device type, then test reliability is improved, but device complexity and costs increase

Engineering Contradiction:
Improvetest reliabilityVSAvoidtesting procedure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

A universal test template is created that can reliably evaluate multiple device types through a single standardized procedure. This eliminates the need for separate complex test procedures for each device type while maintaining test reliability through consistent evaluation criteria.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The test procedure is segmented into standardized, modular components that can be systematically applied to different device types. This segmentation allows for reliable testing across devices without requiring complex customized procedures for each type.

Inventive Principle:
Principle #1Segmentation

3Loss of information

If comprehensive message log analysis is performed manually, then information completeness is improved, but productivity decreases

Engineering Contradiction:
Improveinformation completenessVSAvoidtesting efficiency
Core Design Contradiction:
Loss of informationVSProductivity

Solution Approach 1:

The standardized test template copies proven evaluation methods that ensure comprehensive information capture. This replication of effective evaluation techniques maintains information completeness while automating the process to improve productivity.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The system enables automated self-evaluation of message logs through standardized templates, reducing the need for manual analysis while maintaining comprehensive information capture. The standardized approach allows the system to serve itself in evaluating test results efficiently.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11393507B1Automatic log creation of video recording of a device under test
Publication Date: 2022.07.19 ROHDE & SCHWARZ GMBH & CO KG
  • US11393507B1 patent drawing
  • US11393507B1 patent drawing
  • US11393507B1 patent drawing

AI summary

A method for generating an event log in view of at least one test routine for a device under test, a logging system for logging at least one event frame for a device under test, a method for training a machine learning circuit to extract event frames from multimedia data, and a method for extracting event frames from multimedia data using a machine learning circuit trained are described.