Automated Memory Description Generation for IC Testing

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Solution Overview

Problem

Current methods for testing integrated circuits are time-consuming and error-prone, as designers manually create descriptions to test physical memories, leading to incomplete testing and potential field returns due to the lack of accurate descriptions of physical memories and their enabling signals.

Innovation Solution

Automatically determining and generating a file that describes the association of physical memories with logical memories, including enabling conditions, to facilitate comprehensive testing using MBIST interfaces, reducing the need for manual input and improving testing accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If designers manually create descriptions of physical memories and their enabling signals, then testing can be performed, but the process is time-consuming and error-prone leading to incomplete testing

Engineering Contradiction:
Improvetesting accuracyVSAvoiddesign cycle time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system enables automatic generation of memory descriptions and enabling signal associations by synthesizing tool code that traverses the netlist and extracts memory information autonomously, eliminating the need for manual designer intervention while ensuring complete and accurate testing coverage

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The invention performs automatic memory description generation and enabling signal identification during the synthesis phase before fabrication, preparing all necessary test information in advance to prevent field returns and reduce redesign cycles

Inventive Principle:
Principle #10Preliminary action

2Adaptability or versatility

If manual methods are used to describe physical memories, then flexibility in design modification is maintained, but errors and omissions in testing descriptions occur

Engineering Contradiction:
Improvedesign modification flexibilityVSAvoidtesting description accuracy
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The system automatically traces enabling signals from logical memory interfaces through the netlist to physical memory instances, providing feedback verification that ensures accurate mapping between logical and physical memories while maintaining adaptability to design modifications

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The invention replaces manual mechanical processes of creating and tracking memory descriptions with automated computer-based synthesis tools that systematically extract and verify memory information from netlists, eliminating human error while preserving design flexibility

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Reliability

If automatic determination of physical memories is implemented, then testing accuracy improves, but complexity of the automated system increases

Engineering Contradiction:
Improvetesting completenessVSAvoidautomation system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The synthesis tool is enhanced with multi-functional capabilities to automatically perform netlist traversal, memory instance identification, enabling signal tracing, and test description generation, consolidating multiple functions into a single automated system that improves reliability without proportionally increasing complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS10007489B1Automated method identifying physical memories within a core or macro integrated circuit design
Publication Date: 2018.06.26 CADENCE DESIGN SYST INC
  • US10007489B1 patent drawing
  • US10007489B1 patent drawing
  • US10007489B1 patent drawing

AI summary

A system and method automatically determines the physical memories inside a core or macro and their association with logical memories and their enabling signals. An integrated circuit (IC) source file that describes an integrated circuit in a hardware description language is received. The IC source file includes macros corresponding to memory. For each macro, a physical description file corresponding to the macro is generated. The description includes how the macro corresponds to the physical memory, associations of physical memories with the logical memory, enabling conditions, and data needed to test the memory.