Automated Probe Card Management System for Semiconductor Testing
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Solution Overview
Problem
Current probe card management systems rely heavily on manual processes, leading to inefficiencies and inaccuracies in managing the diverse range of probe cards required for semiconductor DUT testing.
Innovation Solution
A fully automated probe card management system comprising a storage device, an inspection device, and a conveying device, which automatically moves probe cards between these devices based on control signals, ensuring efficient and precise management.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual management methods are used for probe cards, then operational flexibility is maintained, but management efficiency and precision deteriorate
Solution Approach 1:
The patent replaces manual mechanical management operations with an automated control system that includes a controller, display unit, and communication interface. The controller automatically receives probe card information, manages storage locations, and controls conveyance between devices, eliminating manual tracking and movement operations while improving management efficiency and precision.
Solution Approach 2:
The system enables self-service management where the probe card management system automatically tracks, records, and manages probe card information without human intervention. The controller autonomously receives data from testing devices, updates storage records, and coordinates conveyance operations, allowing the system to manage itself and improving overall operational efficiency.
2Measurement precision
If automated warehousing solutions are applied to probe card management, then management precision is improved, but system complexity increases
Solution Approach 1:
The controller serves multiple functions within a single device: it receives probe card information from testing devices, manages storage location records, controls the conveyance device, and communicates with display units. This multi-functional design improves management precision while avoiding the complexity of separate dedicated systems for each function.
Solution Approach 2:
The controller acts as an intermediary between testing devices, storage devices, conveyance devices, and display units. It centralizes control and coordination, simplifying the overall system architecture while maintaining high management precision through automated information flow and coordinated operations across all components.
3Productivity
If manual probe card movement and inspection are performed, then system simplicity is maintained, but productivity and reliability deteriorate
Solution Approach 1:
The patent combines multiple functions into an integrated system: the controller merges information reception, data management, conveyance control, and coordination functions into a single centralized unit. This integration improves operational efficiency by coordinating all operations through one system while managing complexity through unified control logic rather than separate independent systems.
Solution Approach 2:
The system performs preliminary actions by automatically recording probe card information and storage locations before physical conveyance occurs. The controller pre-coordinates movement paths, prepares storage locations, and manages data records in advance, improving operational efficiency and reliability while streamlining the actual physical operations through pre-planned automated sequences.
Data Source
AI summary
The present disclosure provides a management system for probe cards. The management system includes: a storage device, an inspection device and a conveying device. The conveying device is configured to: receive a first conveying device control signal; and convey, according to the first conveying device control signal, a first probe card of the probe cards from a DUT tester device to the inspection device. The inspection device is configured to inspect whether a function of the first probe card is normal. The first probe card is stored in the storage device after the function of the first probe card is inspected as normal.