Automated Probe Positioning for Integrated Circuit Spike Check
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Solution Overview
Problem
Contemporary automated test equipment (ATE) test program spike checking is laborious, time-consuming, and prone to human error, making it inefficient for detecting transient signal spikes in integrated circuits (ICs) during post-silicon testing, which can lead to IC damage or premature failure if not properly executed.
Innovation Solution
A computational system with a processor-controlled actuator apparatus that automates the positioning of a probe tip on selected test points on an IC test board, using novel programming and data sets to map test board information and refine the selection of test points, allowing for automated spike checking and logging without human intervention.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual spike checking is performed by test engineers, then human judgment and flexibility are applied, but the process becomes laborious, time-consuming, and prone to human error
Solution Approach 1:
The patent replaces the manual mechanical probing process with an automated electromechanical probe system. The probe is controlled by a processor to automatically contact test points on the IC, eliminating the need for manual operation while maintaining measurement accuracy. This substitution directly addresses the contradiction by removing human error (improving reliability) while automating the time-consuming aspects of the process (reducing time loss).
Solution Approach 2:
The automated probe system performs self-positioning and self-contact operations under processor control. The system automatically moves the probe to designated test points, makes contact, and records measurements without requiring continuous human intervention. This self-service capability reduces the time engineers spend on repetitive manual tasks while maintaining consistent, error-free operation.
2Measurement precision
If comprehensive spike checking is performed on all test points, then detection accuracy improves, but the complexity and time required for testing increases
Solution Approach 1:
The patent divides the IC test board into discrete test points that can be individually accessed by the automated probe. Each test point is a separate, identifiable location where spike checking can be performed independently. This segmentation allows the system to systematically cover all necessary test points without overwhelming complexity, as each point is handled as a distinct, manageable unit in the automated sequence.
Solution Approach 2:
The system automatically adjusts probing parameters such as contact force, speed, and positioning coordinates based on pre-stored test point data. The processor controls the probe to apply appropriate parameters for each test point, enabling comprehensive coverage without requiring manual adjustment of complex parameters for each measurement location.
3Stability of the object's composition
If automated probe positioning is implemented, then consistency and repeatability improve, but the initial setup and programming complexity increases
Solution Approach 1:
The patent employs pre-stored test point data that contains all necessary positioning and measurement information before the actual spike checking begins. The coordinates, contact parameters, and test sequences are predetermined and stored in memory, allowing the automated probe system to execute consistent, repeatable operations without requiring complex real-time decision-making or programming during the actual testing process.
Data Source
AI summary
Apparatus for cooperating with a stationary integrated circuit test board. The apparatus includes a frame for positioning relative to a stationary integrated circuit test board, where the test board is for coupling to an integrated circuit device under test. The apparatus also includes a probe having a tip, and a processor-controlled actuator apparatus coupled to the frame and for moving the probe tip to selectively electrically contact a test point on the integrated circuit test board.