Automated Raman Optical Trapping for Single-Particle Analysis

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Solution Overview

Problem

Conventional methods for analyzing nanoparticles, such as nanoparticles in solution, rely on multiple techniques that vary in sample requirements and sensitivity, failing to resolve population heterogeneity and are labor-intensive, limiting throughput and statistical power.

Innovation Solution

An automated method and apparatus for single particle Raman trapping analysis (SPARTA) that uses electromagnetic radiation to capture and analyze nanoparticles, employing a beam to define a capture zone, verify particle presence, and acquire data through multiple acquisition procedures to enhance signal-to-noise ratio, enabling high-throughput analysis without labeling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple conventional analysis techniques (DLS, NTA, MS, IR spectroscopy) are used for particle sizing and compositional analysis, then comprehensive particle characterization can be achieved, but sample requirements vary, labor intensity increases, and throughput decreases

Engineering Contradiction:
Improveparticle characterization completenessVSAvoidanalysis throughput
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent combines multiple analysis modalities (Raman spectroscopy, fluorescence spectroscopy, and optical trapping) into a single integrated system. The optical trap holds particles while Raman and fluorescence detectors simultaneously capture compositional and size information, eliminating the need for separate DLS, NTA, MS, and IR spectroscopy measurements and reducing labor intensity.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The optical trap serves multiple functions: it captures particles for analysis, provides a controlled measurement environment, and enables repeated measurements on the same particle. The system can analyze both size and composition simultaneously, making a single technique replace multiple conventional methods.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If conventional bulk analysis techniques are used, then analysis can be performed, but population heterogeneity cannot be resolved

Engineering Contradiction:
Improveheterogeneity resolutionVSAvoidanalysis system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the bulk population into individual particles through optical trapping. By capturing and holding single particles in the trap, the system can analyze each particle's properties independently, resolving heterogeneity that would be averaged out in bulk measurements. The automated system cycles through trapping, measuring, and releasing particles one at a time.

Inventive Principle:
Principle #1Segmentation

3Measurement precision

If manual particle trapping and analysis is performed, then single particle analysis is possible, but labor intensity increases and throughput is limited

Engineering Contradiction:
Improvesingle particle analysis capabilityVSAvoidoperational simplicity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The system performs automated particle trapping, detection, and analysis without manual intervention. The optical trap automatically captures particles, the detectors automatically record Raman and fluorescence signals, and the system automatically cycles through measurements. This self-service automation eliminates manual operations while maintaining single-particle resolution.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Facilitates high-throughput, label-free analysis of nanoparticles, resolving composition heterogeneity and enabling simultaneous sizing and reaction monitoring, overcoming limitations of conventional bulk analysis techniques.

Implementation Method 1

The expression 'particles' in the context of this disclosure is intended to encompass micro- and nano-particles and any other objects that are generally capable of being captured using an electromagnetic beam gradient force trapping effect

Methodology Applied
Scientific Effectbeam gradient force trapping effect: Optical Tweezers

Implementation Method 2

performing a Raman response data gathering procedure sufficient to detect the presence of a predetermined spectral profile above a threshold indicative of a particle capture

Methodology Applied
Scientific EffectRaman scattering: Scattering

Data Source

PatentUS12455224B2Single particle automated Raman trapping analysis
Publication Date: 2025.10.28 IMPERIAL COLLEGE INNVOATIONS LTD
  • US12455224B2 patent drawing
  • US12455224B2 patent drawing
  • US12455224B2 patent drawing

AI summary

An automated method of particle analysis is performed using an electromagnetic radiation source for generating a beam of electromagnetic radiation, a focusing element for directing the beam to a particle capture zone, a detector configured to detect a signal response from the particle capture zone and a control system. An electromagnetic radiation beam is focused onto a particle-conveying medium to define the particle capture zone for capturing a candidate particle within the beam. A first data acquisition procedure is performed to test for particle capture. If particle capture is not detected, the first data acquisition procedure is repeated. If a particle capture is detected within the beam, a second data acquisition procedure is performed to capture particle data using at least one analysis modality, following which the optical beam intensity is reduced to a sub-capture level to release the particle from the particle capture zone. The steps are repeated for successive particles in the particle-conveying medium.