Automated Test Equipment with Local DUT Data Transformation

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Solution Overview

Problem

Conventional automated test equipment faces inefficiencies in multi-site testing due to high computing efforts and limited broadcast efficiency in device-specific communication, leading to excessive data transmission and security threats.

Innovation Solution

Implementing a decentralized test architecture with channel processing units that perform device-specific data transformations and secure communication, reducing the need for extensive data transfer by using device-specific data stored locally and enabling efficient, secure testing of multiple devices simultaneously.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a centralized processing unit is used for device testing, then test control and management is simplified, but data transmission bandwidth requirements increase and communication overhead increases

Engineering Contradiction:

Improvetest control architectureVSAvoiddata transmission volume

Core Design Contradiction:

Device complexityVSQuantity of substance

Solution Approach 1:

The patent divides the centralized processing architecture into distributed channel processing units, each handling device-specific data transformations locally. This segmentation reduces the volume of data that must be transmitted through centralized channels while maintaining effective test control.

Inventive Principle:

Principle #1Segmentation

2Adaptability or versatility

If device-specific data is transmitted to each channel processing unit, then local data transformation capability is improved, but communication overhead and bandwidth requirements increase

Engineering Contradiction:

Improvelocal data transformation capabilityVSAvoidcommunication overhead

Core Design Contradiction:

Adaptability or versatilityVSLoss of energy

Solution Approach 1:

The patent pre-loads essential device-specific data into channel processing units before testing begins. This preliminary action enables local data transformation without requiring continuous communication during test execution, thereby reducing communication overhead while maintaining adaptability.

Inventive Principle:

Principle #10Preliminary action

3Productivity

If multi-site testing is implemented to test multiple DUTs in parallel, then test throughput increases, but computing effort and data stream computation complexity increase

Engineering Contradiction:

Improvetest throughputVSAvoidcomputing effort

Core Design Contradiction:

ProductivityVSDevice complexity

Solution Approach 1:

The patent enables channel processing units to autonomously perform device-specific data transformations using locally stored device-specific data. This self-service capability allows multi-site testing to proceed in parallel without requiring centralized computation for each device, thereby increasing test throughput while managing computing effort efficiently.

Inventive Principle:

Principle #25Self-service

Data Source

PatentUS12467969B2Automated test equipment and method using device specific data

Publication Date: 2025.11.11 ADVANTEST CORP

AI summary

An automated test equipment comprises a tester control configured to broadcast and/or specific upload to matching module input data and/or device-specific data including keys and/or credentials and/or IDs and/or configuration information. The automated test equipment further comprises a channel processing unit configured to transform input data using device specific data in order to obtain device-under-test adapted data for testing the device under test. The channel processing unit further configured to process the DUT data using device specific data in order to evaluate the DUT data. A method and a computer program for testing one or more devices under test in an automated test equipment are also disclosed.