Automated Test System for Electronic Device Output Interfaces
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Manual testing of electronic devices' output interfaces is inaccurate, time-consuming, and labor-intensive, leading to potential errors in determining the normal functioning of multiple interfaces such as VGA, HDMI, S/PDIF, and audio line out.
Innovation Solution
A test system comprising an electronic device and a test device with a processor unit, multiplexer unit, and transforming unit that automatically provides and analyzes test signals across multiple output interfaces, determining conformance to predetermined conditions to generate test result signals, thereby enabling automated testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual testing is used to test output interfaces, then test personnel can directly assess the interfaces, but the testing process becomes time-consuming and labor-intensive
Solution Approach 1:
The test system enables automated self-testing of output interfaces through the processor unit that automatically provides test signals, transforms them, and determines conformance to predetermined conditions without requiring continuous manual intervention
Solution Approach 2:
The patent replaces manual mechanical testing operations with an automated electronic test system that uses a processor unit to generate test signals, transform them through signal processing circuits, and automatically evaluate interface functionality, thereby eliminating time-consuming manual procedures
2Productivity
If manual testing is used to determine interface normality, then test personnel can make judgments, but artificial errors occur reducing test accuracy
Solution Approach 1:
The processor unit performs self-evaluation of test signals by automatically comparing transformed signals against predetermined conditions, eliminating human judgment and its associated errors, thereby improving both efficiency and precision simultaneously
Solution Approach 2:
The system incorporates feedback mechanisms where the processor unit receives test signals, transforms them, evaluates them against predetermined conditions, and generates test result signals that provide automatic feedback on interface normality, ensuring consistent and accurate measurements
3Productivity
If automated testing with processor unit is implemented, then testing becomes automatic and efficient, but device complexity increases
Solution Approach 1:
The processor unit serves multiple functions including generating test signals, transforming received signals, evaluating conformance to predetermined conditions, and generating test result signals, thereby consolidating what could be separate complex components into a single multi-functional unit that improves efficiency without proportionally increasing complexity
Data Source
AI summary
A test system and a test method thereof. The test system includes an electronic device and a test device. The electronic device includes a plurality of output interfaces and provides a corresponding test signal via the output interfaces according to a group of operation commands. The test device includes a transforming unit, a multiplexer unit, a processor unit and a plurality of test interfaces which are respectively coupled to the output interfaces. The transforming unit transforms the test signals received via the test interfaces. The multiplexer unit selects the transformed test signals. The processor unit controls the multiplexer unit to select one of the transformed test signals, and determines whether the transformed test signal being selected conforms a predetermine condition for generating a test result signal. The processor unit controls the communication unit to transmit the test result signal to the electronic device according to the test result signal.