Automatic Analyser Switching Racks for Nonstop Reexamination Control

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Solution Overview

Problem

Existing automatic analysers face inefficiencies in handling small sample amounts that require immediate removal after initial measurement, leading to rack retardation and decreased throughput due to automatic reexamination functions, and complex rack ID settings complicate proper rack usage.

Innovation Solution

An automatic analyser that uses operation mode switching racks to dynamically control reexamination validation and invalidation, allowing immediate removal of samples without stopping measurement, and employs distinct rack shapes or coatings for mode switching, eliminating the need for complex ID settings.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If automatic reexamination function is enabled, then measurement reliability is improved, but rack throughput decreases due to rack retardation

Engineering Contradiction:
Improvemeasurement reliabilityVSAvoidrack throughput
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies different reexamination settings to different racks locally. Rack ID management allows each rack to have independent reexamination validation status, enabling small sample racks to be excluded from automatic reexamination while maintaining the function for other racks. This resolves the contradiction by making reexamination applicable only where needed rather than system-wide.

Inventive Principle:
Principle #3Local quality

2Measurement precision

If automatic reexamination is switched in units of examination objects, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent makes the rack ID management system multi-functional by using it for both rack identification and reexamination control. The same rack ID database serves dual purposes: tracking rack locations and managing reexamination validation status. This reduces device complexity compared to implementing separate examination object-level control systems.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Adaptability or versatility

If complex rack ID settings are implemented, then adaptability is improved, but ease of operation decreases

Engineering Contradiction:
ImproveadaptabilityVSAvoidease of operation
Core Design Contradiction:
Adaptability or versatilityVSEase of operation

Solution Approach 1:

The system performs self-service by automatically managing rack ID assignments and reexamination validation status without requiring manual configuration for each rack. The rack ID management system automatically tracks which racks have small samples and applies appropriate reexamination settings, eliminating the need for operators to manually configure complex parameters.

Inventive Principle:
Principle #25Self-service

Data Source

PatentEP3971579B1Automatic analyser
Publication Date: 2025.08.06 HITACHI HIGH TECH CORP
  • EP3971579B1 patent drawingFigure 1~2
  • EP3971579B1 patent drawingFigure 3
  • EP3971579B1 patent drawingFigure 4

AI summary

Provided is an automatic analyser capable of switching an apparatus operation mode, such as automatic reexamination, without stopping measurement by efficiently using a rack. The automatic analyser includes a storage unit that stores an operation mode, such as automatic reexamination, of the automatic analyser, a detection unit that detects an operation mode switching rack inserted into an insertion unit, and a control unit that switches the operation mode stored in the storage unit on the basis of the detection of the operation mode switching rack by the detection unit. The control unit applies the switched operation mode to an examination object rack transported from the insertion unit to a transport line after the operation mode switching rack.