Axial Ion Beam Extraction via Diffusion Chamber and Multicusp Field

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Solution Overview

Problem

Ion implantation processes face challenges in achieving a wide and uniform ribbon ion beam due to the radially non-uniform plasma density profiles produced by ICP and ECR plasma sources, which limits their application in large area processing.

Innovation Solution

An ion source design incorporating one or two ICP or ECR plasma sources paired with a diffusion chamber and a multicusp magnetic field to create a uniform plasma density along the axial direction, ensuring a uniform extracted ribbon ion beam.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If ICP or ECR plasma sources are used to generate ion beams, then high plasma density and ionization efficiency are achieved, but the radially non-uniform plasma density profile limits the beam uniformity and applicability to large area processing

Engineering Contradiction:
Improveplasma densityVSAvoidbeam uniformity
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The patent transitions from extracting ions radially (perpendicular to the plasma column axis) to extracting ions axially (parallel to the plasma column axis). This dimensional change in extraction geometry allows the use of a slit aperture oriented along the plasma column, capturing ions from a larger volume while maintaining uniformity across the beam width, thus resolving the contradiction between high plasma density and beam uniformity for large area processing

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Area of stationary object

If the extraction aperture area is increased to widen the ion beam, then large area processing capability is improved, but the beam uniformity deteriorates due to the radially non-uniform plasma density profile

Engineering Contradiction:
Improveextraction aperture areaVSAvoidbeam uniformity
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

By orienting the slit aperture axially along the plasma column rather than radially perpendicular to it, the patent enables the extraction aperture to span a large area while maintaining beam uniformity. The axial orientation allows the slit to sample plasma density more uniformly along the plasma column length, overcoming the radial non-uniformity that would otherwise limit uniformity when increasing aperture area

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent uses a slit aperture that effectively copies or samples the plasma density distribution along the axial direction, where the density is more uniform, rather than sampling the radially non-uniform distribution. This copying approach from a more uniform region of the plasma enables large area extraction with maintained uniformity

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables the generation of high-current, uniformly distributed ribbon ion beams over extended widths, improving the uniformity and effectiveness of ion implantation processes, particularly for large diameter wafers and solar cell doping.

Implementation Method 1

power supply 1 delivers the required energy (DC or RF) to the plasma source 2 to enable ionization of the doping gas

Methodology Applied
Scientific EffectInductively coupled plasma (ICP): Electromagnetic Induction

Implementation Method 2

An ion source design incorporating one or two ICP or ECR plasma sources

Methodology Applied
Scientific EffectElectron cyclotron resonance (ECR): Resonance

Implementation Method 3

A beam of positive ions is extracted from the source, accelerated to the desired energy

Methodology Applied
Scientific EffectIon extraction by electric field: Electric Field

Implementation Method 4

A commonly used scheme is a triode combination in which the plasma chamber aperture is at high positive potential, then a second electrode (suppression electrode) at negative potential and finally a third electrode at ground potential

Methodology Applied
Scientific EffectTriode electrode combination: Electrostatic Induction

Implementation Method 5

The extracted ion beam is composed of a mixture of ions. For instance, the beam extracted from BF3 gas will be comprised mainly of BF3+, BF2+, BF+, B+, and F+ ions. Therefore, it is necessary to use the mass analyzer to remove unwanted components from the ion beam

Methodology Applied
Scientific EffectMagnetic field separation: Magnetic Field

Implementation Method 6

To reduce the energy to the desired level, ions of the desired species then pass through a deceleration stage 8, which may include one or more electrodes

Methodology Applied
Scientific EffectElectrostatic deceleration: Electric Field

Implementation Method 7

A corrector magnet 10 is used to expand the ion beam and then transform it into a parallel ribbon ion beam

Methodology Applied
Scientific EffectMagnetic beam expansion: Magnetic Field

Implementation Method 8

An ion source design incorporating one or two ICP or ECR plasma sources paired with a diffusion chamber and a multicusp magnetic field to create a uniform plasma density along the axial direction

Methodology Applied
Scientific EffectDiffusion: Diffusion

Implementation Method 9

a diffusion chamber and a multicusp magnetic field to create a uniform plasma density along the axial direction, ensuring a uniform extracted ribbon ion beam

Methodology Applied
Scientific EffectMulticusp magnetic field: Magnetic Field

Data Source

PatentUS7999479B2Conjugated ICP and ECR plasma sources for wide ribbon ion beam generation and control
Publication Date: 2011.08.16 VARIAN SEMICON EQUIP ASSC INC
  • US7999479B2 patent drawing
  • US7999479B2 patent drawing
  • US7999479B2 patent drawing

AI summary

An ion source, capable of generating high-density wide ribbon ion beam, utilizing one or more plasma sources is disclosed. In addition to the plasma source(s), the ion source also includes a diffusion chamber. The diffusion chamber has an extraction aperture oriented along the same axis as the dielectric cylinder of the plasma source. In one embodiment, dual plasma sources, located on opposing ends of the diffusion chamber are used to create a more uniform extracted ion beam. In a further embodiment, a multicusp magnetic field is used to further improve the uniformity of the extracted ion beam.