Integrated Backscatter X-Ray Assembly for Compact 3D Inspection
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Solution Overview
Problem
Current X-ray backscattering systems for detecting gaps or shims in composite structures are bulky, require multiple robots, suffer from significant X-ray loss, and are impractical for infield inspections, leading to time-consuming and costly manual measurements.
Innovation Solution
An integrated backscatter X-ray assembly with an enclosure housing the X-ray power supply, tube, and detector, submerged in cooling fluid, and a movable base and mobile platform for three-dimensional scanning, enabling efficient detection of thickness and subsurface issues without external cooling systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional X-ray backscattering systems are used, then detection capability is achieved, but device complexity and bulkiness increase
Solution Approach 1:
The patent combines the X-ray source and detector into a single integrated assembly, eliminating the need for separate robotic units. This merging reduces device complexity and bulkiness while maintaining detection capability, as the integrated design allows both components to share common structural support and positioning mechanisms.
Solution Approach 2:
The integrated assembly serves multiple functions: generating X-rays, detecting backscattered X-rays, and providing structural support for both components. This multi-functionality reduces the overall system complexity by eliminating redundant structural elements that would be present in separate conventional systems.
2Ease of operation
If conventional X-ray source with narrow-slit aperture is used, then directional control is improved, but X-ray loss increases significantly
Solution Approach 1:
The patent changes the aperture geometry from a narrow slit to a different configuration that maintains directional control while allowing more X-rays to pass through. This parameter change in aperture design reduces X-ray loss by approximately 90% while preserving the necessary directional control for backscatter detection.
3Measurement precision
If constant triangulation coordinates are maintained, then three-dimensional imagery reconstruction accuracy is improved, but system adaptability decreases
Solution Approach 1:
The patent incorporates feedback mechanisms that continuously monitor and track the positions of the X-ray source and detector. This feedback allows the system to maintain accurate triangulation coordinates dynamically, enabling both high measurement precision for 3D reconstruction and adaptability to different inspection scenarios and geometries.
4Measurement precision
If manual measurement technique is used, then inspection accuracy is achieved, but productivity decreases significantly
Solution Approach 1:
The patent replaces manual mechanical measurement with an automated X-ray backscatter system that uses electronic detection and computer-based analysis. This substitution maintains inspection accuracy through precise measurement capabilities while dramatically increasing productivity by eliminating manual operations and enabling rapid automated scanning.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Provides high-speed, accurate, and compact X-ray backscatter data for three-dimensional reconstruction, overcoming the limitations of conventional systems by integrating components within a single unit and allowing for efficient scanning of large areas.
Implementation Method 1
cooling the X-ray power supply, the X-ray tube and the backscatter X-ray detector during the projecting of the X-ray fan beam and the detecting of the backscatter X-rays using a cooling fluid disposed within the enclosure, the X-ray power supply, the X-ray tube and the backscatter X-ray detector being immersed in the cooling fluid
Implementation Method 2
projecting an X-ray fan beam from the X-ray tube toward the transverse portion of the surface layer at the predetermined longitudinal position
Implementation Method 3
detecting backscatter X-rays reflected by the article under test at the backscatter X-ray detector in response to the projecting of the X-ray fan beam
Data Source
AI summary
Integrated backscatter X-ray assemblies for detecting backscatter X-rays reflected by a target area of an article under test are disclosed. The integrated backscatter X-ray assembly includes an enclosure, an X-ray power supply, an X-ray tube, a backscatter X-ray detector and a cooling fluid. The X-ray power supply disposed within the enclosure. The X-ray tube disposed within the enclosure and operatively coupled to the X-ray power supply. The backscatter X-ray detector is disposed within the enclosure. The cooling fluid disposed within the enclosure such that the X-ray power supply, the X-ray tube and the backscatter X-ray detector are immersed in the cooling fluid. In various examples, integrated backscatter X-ray assemblies may also include a movable base and/or a mobile platform. Methods for detecting backscatter X-rays reflected by a target area of an article under test are also disclosed.