Backscatter X-ray System Slit Scanning Spatial Resolution
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Solution Overview
Problem
Existing X-ray imaging systems rely on transmission through objects, which limits their effectiveness in non-destructive examination and imaging of objects from a single side.
Innovation Solution
A backscatter X-ray system that uses a slit-based X-ray source to scan a sheet of X-rays across an object, illuminating only one line at a time, and a sensor with slits or pixel lines to differentiate backscattered X-rays from different spots along the line.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional X-ray source illuminates the entire object surface, then the imaging coverage is complete, but the spatial resolution and ability to differentiate backscattered X-rays from specific spots deteriorates
Solution Approach 1:
The patent applies segmentation by using a slit aperture to divide the X-ray beam into a thin sheet that illuminates only one line on the object surface at a time. This spatial segmentation allows the sensor to differentiate backscattered X-rays from specific spots along the line, achieving high spatial resolution while maintaining complete imaging coverage through scanning
Solution Approach 2:
The patent employs dynamic scanning where the slit-based X-ray source moves across the object surface to illuminate different lines sequentially. This dynamic approach transforms a static wide-area illumination problem into a dynamic sequential scanning process, maintaining high spatial resolution at each position while covering the entire object over time
2Adaptability or versatility
If transmission X-ray imaging is used, then internal structure imaging is achieved, but non-destructive examination from a single side is limited
Solution Approach 1:
The patent inverts the conventional transmission X-ray approach by detecting backscattered X-rays that reflect off the object surface rather than transmitting through it. This inversion enables single-sided imaging where both the X-ray source and sensor are positioned on the same side of the object, eliminating the need for dual-sided access while maintaining effective non-destructive examination capability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This system achieves high spatial resolution and effective non-destructive imaging by selectively illuminating and detecting backscattered X-rays from specific spots on the object, enhancing the ability to differentiate material properties.
Implementation Method 1
an X-ray source configured to scan a sheet of X-ray across an object, wherein the sheet of X-ray illuminates one line on a surface of the object
Implementation Method 2
a sensor configured to differentiate backscattered X-ray from different spots along the line
Data Source
AI summary
Disclosed herein is a backscatter X-ray system comprising: an X-ray source configured to scan a sheet of X-ray across an object, wherein the sheet of X-ray illuminates one line on a surface of the object; a sensor configured to differentiate backscattered X-ray from different spots along the line.