Backscatter X-Ray Imaging for Inspection Through Insulation
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Solution Overview
Problem
Existing X-ray imaging systems fail to efficiently inspect and assess the state of materials beneath an insulation layer without requiring removal of the insulation, due to size, weight, and power constraints, and complex geometries of the target features such as support fins, inspection ports, pipe fittings, or other structures, and the presence of corrosion, cracking, or other degradation.
Innovation Solution
A reduced-size, weight, and power (SWaP) X-ray backscatter imaging system incorporated into a wall-climbing robot that scans a beam of X-rays along a first direction perpendicular to its motion, using a rotating collimator and intrinsically steerable X-ray emitter, and a detector configured to detect X-rays at multiple wavelengths, allowing non-destructive imaging of complex geometries.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional X-ray imaging systems are used to inspect materials beneath insulation layers, then imaging capability is achieved, but system size, weight, and power consumption increase
Solution Approach 1:
The patent extracts only the essential X-ray generation and detection components needed for backscatter imaging, eliminating unnecessary subsystems and functionalities of traditional X-ray systems. This extraction approach enables achieving imaging capability with a minimized system footprint and reduced weight suitable for portable or handheld deployment
Solution Approach 2:
The patent replaces traditional mechanical X-ray tube assemblies with solid-state or miniaturized X-ray generation components, and substitutes bulky mechanical detection systems with compact semiconductor-based detectors. This substitution of mechanical systems with solid-state alternatives significantly reduces system size and weight while maintaining imaging performance
2Measurement precision
If traditional X-ray imaging systems are used to inspect materials beneath insulation layers, then imaging capability is achieved, but power consumption increases
Solution Approach 1:
The patent employs pulsed or periodic X-ray emission rather than continuous operation, allowing the system to achieve necessary imaging data collection during brief activation intervals. This periodic action significantly reduces average power consumption while maintaining sufficient signal acquisition for imaging materials beneath insulation layers
Solution Approach 2:
The patent utilizes low-cost, short-lived X-ray photon sources that require minimal power input, accepting that each photon burst is a transient event. This approach prioritizes sufficient imaging capability over sustained high-power operation, enabling portable deployment with battery or low-power supply
3Measurement precision
If insulation layers are removed to inspect equipment, then inspection accuracy is improved, but time loss and operational disruption increase
Solution Approach 1:
The patent introduces an intermediary backscatter imaging system that can penetrate and image through insulation layers without requiring their removal. This intermediary approach provides sufficient inspection accuracy for many applications while avoiding the time loss and operational disruption associated with insulation removal and reinstallation
Solution Approach 2:
The patent accepts that imaging through insulation layers provides slightly reduced compared to direct imaging of exposed surfaces. This partial action approach prioritizes speed and operational continuity, achieving sufficient inspection accuracy for detecting major defects, corrosion, or anomalies without the excessive time investment required for complete insulation removal
4Adaptability or versatility
If complex geometries with support fins, inspection ports, and pipe fittings are inspected, then comprehensive coverage is achieved, but system complexity increases
Solution Approach 1:
The patent employs a dynamically adjustable imaging system with movable or articulating components that can adapt their position and orientation to match complex geometries. The system includes adjustable detectors and collimators that can be repositioned to image around support fins, inspection ports, and pipe fittings, providing comprehensive coverage without requiring a complex multi-component system
Solution Approach 2:
The patent designs a universal imaging system with multi-functional capabilities that can handle various geometry types using the same core components. The system employs software-controlled positioning and imaging parameter adjustment rather than dedicated hardware for each geometry type, reducing overall system complexity while maintaining adaptability to complex structures
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The reduced-size and power (SWaP) X-ray imaging system allows for non-invasive inspection of complex geometries by incorporating a backscatter X-ray imaging system into a wall-climbing robot, enabling efficient imaging beneath insulation layers with reduced size, weight, and power requirements.
Implementation Method 1
an X-ray emitter, wherein the X-ray emitter is operable to generate a beam of X-rays
Implementation Method 2
an X-ray detector, wherein the X-ray detector is operable to detect X-rays emitted from the X-ray emitter and scattered back toward the X-ray detector from the wall
Data Source
AI summary
Embodiments are provided to facilitate X-ray backscatter imaging of equipment that is covered by insulation or other materials that it is undesirable to remove and/or that is difficult to access (e.g., due to distance from the ground and/or catwalks or other support structures). These embodiments include improved collimators or other elements to facilitate scanning of the X-ray beam in at least one direction while also maintaining a low size, weight, and power (SWaP). These embodiments also include improved detectors to more readily allow improved X-ray backscatter images and material composition (including detection of the presence of oxides or other evidence or corrosion or degradation) to be detected, even in SWaP-limited applications like remote vessel inspection.