Backscattered Near-Infrared Light Brain Abnormality Detection

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Solution Overview

Problem

Current medical diagnostic tools for detecting brain abnormalities, such as CT scans, are costly, time-consuming, and expose patients to harmful radiation, while existing non-X-ray devices lack accuracy and ease of use.

Innovation Solution

A system and method using backscattered near-infrared (NIR) light to detect brain abnormalities by calculating insertion loss and phase difference from pulsed incident and backscattered light beams, allowing for non-invasive and cost-effective diagnosis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If CT scan is used to detect brain abnormalities, then diagnostic accuracy is improved, but patient exposure to harmful radiation increases and cost increases

Engineering Contradiction:

Improvediagnostic accuracyVSAvoidradiation exposure

Core Design Contradiction:

Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent replaces the X-ray based CT scan system with an optical system using near-infrared (NIR) light. Instead of using ionizing radiation to image brain tissue, the invention uses NIR light that penetrates the scalp and skull to detect backscattered light patterns from brain abnormalities. This substitution eliminates harmful radiation exposure while maintaining diagnostic capability through optical properties of tissue.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the physical parameter used for imaging from X-ray attenuation (CT scan) to optical backscattering properties. By measuring the intensity and time-of-flight of backscattered NIR light, the system detects changes in tissue optical properties that indicate abnormalities such as hemorrhages, tumors, or strokes, achieving diagnostic accuracy without ionizing radiation.

Inventive Principle:

Principle #35Parameter changes

2Measurement precision

If CT scan is used to detect brain abnormalities, then diagnostic capability is improved, but time consumption increases

Engineering Contradiction:

Improvediagnostic capabilityVSAvoidtime consumption

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent uses pulsed NIR light sources that emit light in periodic pulses rather than continuous illumination. This pulsed approach allows for time-gated detection of backscattered light, enabling the system to distinguish between light scattered from different depths and to acquire diagnostic data more rapidly, reducing the time required for brain abnormality detection.

Inventive Principle:

Principle #19Periodic action

3Ease of manufacture

If ultrasound device is used for brain imaging, then cost is reduced and portability is improved, but measurement accuracy deteriorates

Engineering Contradiction:

Improvecost and portabilityVSAvoiddiagnostic accuracy

Core Design Contradiction:

Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent replaces the ultrasound-based imaging system with an optical detection system using NIR light. Instead of using sound waves that are poorly transmitted by skull bone, the invention uses optical photons that can penetrate the scalp and skull to reach brain tissue. The backscattered light carries information about tissue optical properties, providing accurate detection of brain abnormalities with a portable, low-cost device.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system provides a sensitive and specific indication of brain abnormalities, including hemorrhages, tumors, and ischemic strokes, without the need for expensive equipment or harmful radiation, offering a more efficient and patient-friendly diagnostic tool.

Implementation Method 1

backscatter radiation detectors are used for medical imaging... backscatter technology is based on the Compton scattering effect of X-rays... backscattered near infrared (NIR) light

Methodology Applied

Scientific EffectLight scattering: Scattering

Implementation Method 2

backscatter technology is based on the Compton scattering effect of X-rays... backscattered near infrared (NIR) light

Methodology Applied

Scientific EffectCompton scattering: Compton Scattering

Data Source

PatentUS12303284B2System and method for detecting brain abnormalities using backscattered radiation

Publication Date: 2025.05.20 ABOERJAIB SARAH Y Y

AI summary

At least one pulsed incident beam of light is directed toward a portion of the brain of a patient. At least one backscattered beam of light from the portion of the patient's brain is received and an insertion loss, IL, is calculated asIL=2⁢0⁢log⁢AB⁢SAI,where ABS is an amplitude of the at least one backscattered beam of light, and where AI is an amplitude of the at least one pulsed incident beam of light. An insertion phase difference, IPD, is calculated as IPD=ϕBS−ϕI, where ϕBS is a phase of the at least one backscattered beam of light, and where ϕI is a phase of the at least one pulsed incident beam of light. It is then determined if the patient has a brain abnormality based on the calculated insertion loss and the insertion phase difference.