Backscattering Detector Shielding for Inner-Layer X-Ray Imaging
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
X-ray backscattering imaging technology struggles to clearly image inner layer structures in multi-layer objects due to interference from stronger scattered radiation from outer layers, which overwhelms detector signals and degrades imaging quality.
Innovation Solution
A backscattering inspection device with a shielding assembly that surrounds detectors to block outer layer scattered rays, using I-shaped and L-shaped shielding members to obstruct incident and scattered rays, and a collimator to enhance signal clarity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If detectors are used to receive scattered rays from multi-layer structures, then imaging capability is obtained, but outer layer scattered rays interfere with inner layer imaging quality
Solution Approach 1:
A shielding assembly is introduced as an intermediary component between the detectors and the multi-layer structure. The shielding assembly includes multiple shielding members arranged to selectively block scattered rays from different layers, allowing inner layer signals to reach detectors while blocking outer layer interference. This mediator resolves the contradiction by filtering harmful outer layer radiation without preventing useful inner layer radiation.
Solution Approach 2:
The shielding assembly is divided into multiple independent shielding members, each positioned at specific angles relative to the detectors. Each shielding member segments the field of view to block rays from specific outer layer regions while allowing rays from inner layer regions to pass through. This segmentation enables selective reception of scattered rays from different depth layers.
2Measurement precision
If shielding members are added to block outer layer rays, then imaging accuracy improves, but device complexity increases
Solution Approach 1:
The shielding members are designed with dual functionality: they serve both as structural support elements and as radiation shielding components. The same shielding members that provide mechanical framework also perform the critical function of blocking outer layer scattered rays. This multi-functionality reduces the need for additional separate shielding components, thereby limiting the increase in device complexity.
Solution Approach 2:
The shielding members are arranged in a nested configuration where multiple shielding layers are positioned at different radial distances from the detectors. Each shielding member is nested within the field of view defined by outer shielding members, creating a hierarchical structure that efficiently blocks rays from multiple outer layer regions with a compact arrangement of components.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device enhances the accuracy of imaging inner layer structures by reducing interference from outer layers, allowing for clearer backscattering images of the inner layer structure.
Implementation Method 1
X-ray backscattering imaging technology may detect the intensity of X-ray scattering by different substances so as to obtain the substance images of the inspected object within a certain depth
Implementation Method 2
a shielding assembly configured to at least partially surround the detectors so as to obstruct a portion of the incident rays from reaching the detectors, and obstruct outer layer scattered rays of the incident rays from the outer layer structure body from reaching the detectors
Data Source
Figure 1
AI summary
The present disclosure provides a backscattering inspection device for detecting an m-layer structured object under inspection, which is applied to the field of detection technology. The m-layer structured object under inspection at least includes an outer layer structure body and an inner layer structure body, where m is an integer greater than or equal to 2. The backscattering inspection device includes a ray generator, n detectors and a shielding assembly, wherein the ray generator is arranged above the outer layer structure body and configured to emit incident rays to the m-layer structured object under inspection. n detectors are arranged above the outer layer structure body and located in the circumferential direction of the incident rays to receive the inner layer scattered rays of the incident rays from the inner layer structure body, where n is an integer greater than or equal to 1. The shielding assembly is configured to at least partially surround the detectors, so as to obstruct a portion of the incident rays from reaching the detectors, and obstruct the outer layer scattered rays of the incident rays from the outer layer structure body from reaching the detectors.