Backside Capacitor Integration for Higher-Capacitance Semiconductors

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Solution Overview

Problem

As semiconductor devices continue to integrate more components into a given area through reduced minimum feature sizes, challenges arise in efficiently utilizing space for capacitors, leading to potential performance limitations.

Innovation Solution

The solution involves bonding capacitors to the backside of transistor structures through hybrid bonding, allowing for the formation of larger capacitors without occupying front-side interconnect space, thereby enhancing device performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If capacitors are formed on the front side of the semiconductor device, then the capacitance increases, but the available area for interconnect structures decreases

Engineering Contradiction:
ImprovecapacitanceVSAvoidinterconnect space
Core Design Contradiction:
Quantity of substanceVSArea of stationary object

Solution Approach 1:

The patent applies dimensionality change by moving capacitor formation from the traditional front-side planar space to the backside surface of the semiconductor device. This utilizes the third dimension (depth/vertical space) by bonding capacitors to the opposite side of the substrate from the interconnect structures, effectively doubling the available space for passive components without compromising front-side interconnect area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If minimum feature sizes are reduced to increase integration density, then more components can be integrated, but manufacturing precision requirements increase

Engineering Contradiction:
Improveintegration densityVSAvoidfeature size control
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent extracts capacitors from the front-side integrated circuit area and relocates them to the backside of the device. This separation allows the front side to focus exclusively on high-precision interconnect and transistor fabrication at reduced feature sizes, while capacitor formation on the backside operates independently with less stringent precision requirements.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the creation of capacitors with higher capacitance without area penalties, improving semiconductor device performance by optimizing space utilization.

Implementation Method 1

bonding capacitors to the backside of transistor structures through hybrid bonding

Methodology Applied
Scientific EffectHybrid bonding: Welding

Data Source

PatentUS20250329630A1Semiconductor devices including backside capacitors and methods of manufacture
Publication Date: 2025.10.23 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250329630A1 patent drawing
  • US20250329630A1 patent drawing
  • US20250329630A1 patent drawing

AI summary

Semiconductor devices including backside capacitors and methods of forming the same are disclosed. In an embodiment, a semiconductor device includes a first transistor structure; a front-side interconnect structure on a front-side of the first transistor structure, the front-side interconnect structure including a front-side conductive line; a backside interconnect structure on a backside of the first transistor structure, the backside interconnect structure including a backside conductive line, the backside conductive line having a line width greater than a line width of the front-side conductive line; and a first capacitor structure coupled to the backside interconnect structure.