Back-Side Contacts via Epitaxial Layer Stack
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Solution Overview
Problem
The existing techniques for fabricating back-side contacts on semiconductor layers face challenges such as lateral spread of dopants causing short circuits and substrate deformation, leading to deteriorated source and channel series resistances during the thinning and bonding processes.
Innovation Solution
A semiconductor structure with at least four epitaxial layers, where back-side contacts are formed without front-side implantation, allowing for the integration of back-side semiconductor devices with front-side logic devices, utilizing epitaxial layers with specific conductivity types and doping concentrations to enable efficient contact formation and connection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Temperature
If front-side implantation is used to form back-side contacts, then the thermal budget limit is circumvented, but lateral spread of dopants causes short circuits between source and drain terminals
Solution Approach 1:
Instead of forming back-side contacts through front-side implantation (conventional approach), the patent inverts the process by forming the contacts directly on the back-side of the semiconductor layer. This reversal eliminates the lateral dopant spread issue while maintaining thermal budget control, as the contacts are formed after thinning when the back-side is accessible.
Solution Approach 2:
The patent performs preliminary thinning of the semiconductor substrate to expose the back-side surface before forming the back-side contacts. This preliminary action enables direct access to the back-side for contact formation, avoiding the need for front-side implantation and its associated dopant spread problems.
2Adaptability or versatility
If the semiconductor substrate is thinned to fabricate back-side devices, then new system and processing possibilities are opened, but substrate deformation occurs during thinning and bonding processes
Solution Approach 1:
The patent segments the semiconductor structure into distinct functional layers: a thinned semiconductor layer containing front-side logic devices, and a separate substrate that provides mechanical support. This segmentation allows the semiconductor layer to be thinned for back-side device fabrication while the substrate maintains structural stability and prevents deformation during processing.
3Ease of manufacture
If the semiconductor substrate is thinned to expose the back-side surface, then back-side semiconductor devices can be fabricated, but overlay between back-side contacts and back-side devices deteriorates due to substrate deformation
Solution Approach 1:
The patent inverts the conventional sequence by first thinning the substrate to expose the back-side, then forming the back-side contacts and devices in a single alignment step. This reversal ensures that all back-side structures are defined relative to each other without being affected by subsequent substrate deformation, thereby maintaining precise overlay alignment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for the fabrication of back-side contacts that effectively connect back-side semiconductor devices to front-side logic devices without the need for front-side implantation, reducing the risk of short circuits and substrate deformation, thereby improving the reliability and performance of the semiconductor structure.
Implementation Method 1
at least four epitaxial layers, which are arranged on a back-side of the semiconductor layer
Data Source
AI summary
An example includes a semiconductor structure including a semiconductor layer, front-side logic devices arranged in a front-side of the semiconductor layer, four epitaxial layers on a back-side of the semiconductor layer, where the four epitaxial layers include a first epitaxial layer of a first conductivity type, a second epitaxial layer of a second conductivity type, a third epitaxial layer of the second conductivity type, and a fourth epitaxial layer of the first conductivity type, a plurality of back-side contacts exposed at a back-side surface of the fourth epitaxial layer, where the plurality of back-side contacts include a set of first terminal contacts extending into and contacting the fourth epitaxial layer, a set of second terminal contacts extending into and contacting the second epitaxial layer, a set of first gate contacts extending into the third epitaxial layer, and a set of second gate contacts extending into the first epitaxial layer.


