Backside Power Network With Integrated Gate Signal Routing

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Solution Overview

Problem

Current semiconductor device architectures face challenges in scaling due to increasing resistance in power delivery interconnects as devices shrink, particularly in providing effective power connections to transistor gates through backside power delivery methods.

Innovation Solution

A backside power distribution network is designed with integrated signal lines and power rails, where n-channel and p-channel field-effect transistors on a wafer have power rails connected to source/drain regions on the backside and signal lines connected to the gates, enabling efficient power delivery and signal transmission between adjacent transistors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If device dimensions are scaled down, then device size is reduced, but resistance of interconnects increases exponentially

Engineering Contradiction:
Improvedevice sizeVSAvoidpower delivery efficiency
Core Design Contradiction:
Volume of moving objectVSReliability

Solution Approach 1:

The patent moves the power delivery network from the frontside to the backside of the wafer, utilizing the third dimension (vertical stacking) to resolve the resistance issue. By routing power delivery layers to the backside, the invention creates shorter and more direct power paths to transistor gates, bypassing the resistance bottleneck caused by scaled-down frontside interconnects.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If backside power delivery is implemented, then power delivery resistance is reduced, but gate connection capability is lacking

Engineering Contradiction:
Improvepower delivery efficiencyVSAvoidgate connection capability
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The backside of the wafer is designed to accommodate multiple functions: power delivery through power rails and gate signaling through signal lines. This multi-functional approach allows the backside power delivery network to simultaneously provide both power and control signals to transistors, making the architecture versatile enough to replace traditional frontside interconnects for both purposes.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Adaptability or versatility

If signal lines and power rails are integrated on backside, then device functionality is improved, but fabrication complexity increases

Engineering Contradiction:
Improvedevice functionalityVSAvoidfabrication complexity
Core Design Contradiction:
Adaptability or versatilityVSEase of manufacture

Solution Approach 1:

The backside power delivery network is segmented into distinct functional components: power rails for power delivery and signal lines for gate control. This segmentation allows each component to be optimized independently for its specific function while simplifying the fabrication process, as different material stacks and processing conditions can be applied to different regions of the backside.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20240063283A1Backside Power Distribution Network and Signal Line Integration
Publication Date: 2024.02.22 INTERNATIONAL BUSINESS MACHINE CORPORATION
  • US20240063283A1 patent drawing
  • US20240063283A1 patent drawing
  • US20240063283A1 patent drawing

AI summary

A backside power distribution network is provided having an integrated signal line with a backside connection to a transistor gate. In one aspect, a semiconductor device includes: NFETs and PFETs adjacent to one another on a frontside of a wafer; power rails, connected to source/drain regions of the NFETs and PFETs, present on a backside of the wafer in a space between adjacent NFETs and in a space between adjacent PFETs; and a signal line, connected to a gate of the NFETs and PFETs, present on the backside of the wafer in a space between an adjacent NFET and PFET. The NFETs and PFETs can each include a stack of active layers, and gates surrounding at least a portion of each of the active layers in a gate-all-around configuration. A method of fabricating the present semiconductor devices is provided.