Backside Image Sensor and Processor Die Bonding for Low-Latency Cameras

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Solution Overview

Problem

Conventional image sensor devices experience signal propagation delays due to the separation between the image sensor device and its associated controller or image processor chips, which affects camera performance.

Innovation Solution

The integration of an image sensor device and a processor or controller die within a common package, where the image sensor die and processor die are bonded using dielectric layers with metallic pads for direct electrical connectivity, reducing the need for separate chips and thus minimizing signal propagation delays.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the image sensor device is coupled to separate controller and image processor chips, then the functional separation allows for specialized processing, but the distance between components causes signal propagation delays that negatively impact camera performance

Engineering Contradiction:
Improvecamera performanceVSAvoidsignal propagation delay
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent combines the image sensor device, controller chip, and image processor chip into a single integrated package. The controller die and image processor die are mounted on the same substrate as the image sensor die, with electrical connections established through conductive vias and trace patterns on the substrate. This integration eliminates the need for external connections between separate chips, thereby reducing signal propagation delay and improving camera performance.

Inventive Principle:
Principle #5Merging (Combining)

2Adaptability or versatility

If separate chips are used for image sensor, controller, and image processor, then each component can be optimized independently, but the overall device size and complexity increase

Engineering Contradiction:
Improvecomponent optimizationVSAvoidnumber of separate chips
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent implements a nested structure where the controller die and image processor die are mounted on the same substrate as the image sensor die. The substrate acts as a carrier that hosts multiple functional dies in a compact arrangement. This nesting approach allows each component to maintain its optimized design while being integrated into a unified package, reducing the overall device complexity compared to using completely separate external chips.

Inventive Principle:
Principle #7Nested doll (Nesting)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration reduces signal propagation delays and allows for a more compact, high-performance camera system by directly connecting the image sensor and processor elements, enhancing the overall camera functionality.

Implementation Method 1

The reconstituted wafer and the image sensor wafer are bonded to one another including coupling the first surface of the first dielectric layer and the second surface of the second dielectric layer

Methodology Applied
Scientific EffectDielectric bonding: Welding

Data Source

PatentUS11935907B2Image sensor device
Publication Date: 2024.03.19 ADEIA SEMICON TECH LLC
  • US11935907B2 patent drawing
  • US11935907B2 patent drawing
  • US11935907B2 patent drawing

AI summary

Methods of forming a back side image sensor device, as well as back side image sensor devices formed, are disclosed. In one such a method, an image sensor wafer having a first dielectric layer with a first surface is obtained. A reconstituted wafer having a processor die and a second dielectric layer with a second surface is obtained. The reconstituted wafer and the image sensor wafer are bonded to one another including coupling the first surface of the first dielectric layer and the second surface of the second dielectric layer. In another method, such formation is for a processor die bonded to an image sensor wafer. In yet another method, such formation is for a processor die bonded to an image sensor die.