Centralized Backup Power Module for NVDIMM Testing
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Solution Overview
Problem
Existing Automatic Test Equipment (ATE) systems face challenges in efficiently testing non-volatile dual in-line memory modules (NVDIMM) due to limitations in energy capacity, charging time, and system re-setup requirements, particularly with legacy systems failing to meet current performance and reliability standards.
Innovation Solution
A centralized backup power support system utilizing an external power supply with individual protection circuits and a resistor network instead of electric double-layer capacitors (EDLCs) to provide unlimited energy capacity and zero charge waiting time, allowing for efficient testing of NVDIMMs across various densities without the constraints of EDLC-based systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Use of energy by moving object
If EDLC-based backup power modules are used in ATE systems, then energy capacity is provided for testing NVDIMM, but charging time is required and energy storage is limited
Solution Approach 1:
The patent removes the EDLC (electric double-layer capacitor) component from the backup power module, extracting the energy storage function from the traditional capacitor-based system. This extraction eliminates the charging time requirement while maintaining the backup power functionality through an alternative energy storage approach using supercapacitors with higher energy density and faster charge/discharge characteristics.
Solution Approach 2:
The patent changes the energy storage parameter from EDLC to supercapacitor, utilizing the superior electrical characteristics of supercapacitors. This parameter change enables unlimited energy capacity and zero charge waiting time by leveraging the higher capacitance values and faster response times of supercapacitor technology compared to traditional EDLC.
2Reliability
If EDLC-based backup power modules are used, then backup power is provided for memory modules, but production costs increase and reliability decreases due to aging
Solution Approach 1:
The patent replaces expensive and aging-prone EDLC components with more reliable and cost-effective supercapacitor solutions. The new design uses components that have longer operational lifetimes and lower degradation rates, eliminating the need for frequent replacements and reducing overall production costs despite the initial component investment.
Solution Approach 2:
The patent converts the harmful aging effect of EDLC into a benefit by using supercapacitors that are inherently more resistant to degradation. The design leverages the superior stability and longer lifespan of supercapacitors to eliminate the reliability issues associated with EDLC, turning a potential failure mode into a strength.
3Adaptability or versatility
If legacy ATE systems are used for testing, then existing programming environments are maintained, but performance and reliability fail to meet current expectations
Solution Approach 1:
The patent creates a universal backup power solution that can support various NVDIMM densities and testing configurations through a single modular design. The system provides multi-functional capabilities by accommodating different memory module types and densities while maintaining consistent performance and reliability, enabling the ATE system to adapt to current testing requirements without requiring multiple specialized systems.
Data Source
AI summary
Approaches, techniques, and mechanisms are disclosed for a centralized backup power support system that improves testability of non-volatile dual in-line memory modules (NVDIMM) on Automatic Test Equipment (ATE) testers and in-system tests. An NVDIMM includes both volatile memories and non-volatile memories. According to an embodiment, a compact backup power distribution board is powered with an external power supply with an individual protection circuit. The backup power distribution board has an unlimited energy capacity for any density of NVDIMM and zero charge waiting time. According to an embodiment, instead of using an electric double-layer capacitor (EDLC) to support backup power, a resistor is used instead of an EDLC on each backup power module. There is no charging time when the backup power module does not have EDLC cells, resulting in significant reduction in test time and production cost and increase in production output.