Bandgap Reference Core Circuit With Adjustable Voltage Division

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Solution Overview

Problem

Traditional bandgap voltage reference sources have limited output voltage range and are prone to current mirror matching errors due to complex transistor structures, affecting their performance.

Innovation Solution

A bandgap voltage reference core circuit with generating, first, and second voltage dividing circuits that generate positive and negative temperature coefficient voltages and currents, allowing for adjustable reference voltage through controlled voltage dividing proportions, resulting in a first-order zero temperature drift coefficient.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a traditional bandgap voltage reference source is used, then the reference voltage is stable with first-order zero temperature drift, but the output voltage range is limited and not adjustable

Engineering Contradiction:

Improveoutput voltage rangeVSAvoidvoltage dividing circuit structure

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The voltage reference circuit is segmented into multiple independent voltage dividing circuits (first voltage dividing circuit and second voltage dividing circuit), each capable of independently adjusting voltage division ratios. This segmentation allows flexible combination to achieve different output voltages while maintaining temperature compensation functionality.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The voltage dividing circuits are designed with adjustable parameters, allowing dynamic adjustment of voltage division ratios. This enables the reference voltage output to be dynamically tuned to different values while preserving the temperature-independent characteristic.

Inventive Principle:

Principle #15Dynamics

2Reliability

If a current mirror is used in traditional bandgap reference, then the circuit structure is compact, but matching errors occur affecting performance

Engineering Contradiction:

Improveperformance accuracyVSAvoidtransistor structure

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The current mirror structure is extracted and replaced with voltage dividing circuits based on resistors and transistors operating in different regions. This removes the source of matching errors while maintaining the compact integrated circuit implementation.

Inventive Principle:

Principle #2Taking out (Extraction)

Solution Approach 2:

Instead of using a current mirror to copy current, the patent uses voltage dividing circuits to generate proportional voltages that achieve the same functional effect without the matching error inherent in current copying.

Inventive Principle:

Principle #26Copying

3Adaptability or versatility

If voltage dividing circuits are added to enable adjustment, then the output reference voltage range is expanded, but the device complexity increases

Engineering Contradiction:

Improvevoltage adjustabilityVSAvoidcircuit structure

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The voltage dividing circuits are designed to serve multiple functions: they provide voltage adjustment capability while simultaneously maintaining temperature compensation. The same circuit structures achieve both voltage scaling and temperature-independent operation, reducing overall system complexity.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Expands the output reference voltage range beyond 1.2 V, eliminating current mirror errors and improving performance by enabling adjustable voltage output.

Implementation Method 1

a generating circuit, a first voltage dividing circuit and a second voltage dividing circuit. The generating circuit is configured to generate a positive temperature coefficient voltage and a negative temperature coefficient voltage

Methodology Applied

Scientific EffectTemperature coefficient effect:

Implementation Method 2

the reference voltage has a first-order zero temperature drift coefficient

Methodology Applied

Scientific EffectTemperature drift compensation:

Data Source

PatentUS12510911B2Bandgap voltage reference core circuit, bandgap voltage reference source and semiconductor memory

Publication Date: 2025.12.30 CHANGXIN MEMORY TECH INC

AI summary

A bandgap voltage reference core circuit includes: a generating circuit, a first voltage dividing circuit and a second voltage dividing circuit. The generating circuit is configured to generate a positive temperature coefficient voltage and a negative temperature coefficient voltage, and obtain a positive temperature coefficient current and a negative temperature coefficient current based on the positive temperature coefficient voltage and the negative temperature coefficient voltage. The first voltage dividing circuit is connected to the generating circuit and the second voltage dividing circuit respectively, and is configured to generate an initial current based on the positive temperature coefficient current and the negative temperature coefficient current. The second voltage dividing circuit is configured to determine a reference voltage based on the initial current. The first voltage dividing circuit and the second voltage dividing circuit affect a voltage dividing proportion of the reference voltage.