Baseband Chip Test Interface Switching for Bluetooth Lead Reduction
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Solution Overview
Problem
The conventional method of testing Bluetooth chips integrated into baseband chips requires reserving two data leads, leading to resource wastage and increased costs, as it necessitates direct connection with test equipment, which is not utilized during normal operation.
Innovation Solution
A communication device with switches and a test control unit that allows the target test chip to be connected directly with data transport interfaces, enabling testing without reserved leads, and includes a format conversion unit to adapt data formats between the test chip and test equipment, reducing the need for additional storage resources.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the conventional test method is used to test the Bluetooth chip integrated into the baseband chip, then the Bluetooth chip can be tested by connecting with test equipment, but two data leads must be reserved in the baseband chip which are unused during normal operation, causing waste of lead resources
Solution Approach 1:
The data transport interface is designed to serve dual purposes: during normal operation it handles data communication between the baseband chip and external devices, and during testing it connects the Bluetooth chip to the test equipment. This multi-functional design eliminates the need for separate dedicated test leads while maintaining full testing capability.
Solution Approach 2:
The patent combines the test data path with the normal data communication path by using the same data transport interface for both testing and operational purposes. The switching mechanism merges these two functions into a single shared resource, thereby eliminating redundant lead resources.
2Reliability
If two data leads are reserved for testing the Bluetooth chip, then the testing can be performed, but the baseband chip requires additional lead resources that increase complexity and cost
Solution Approach 1:
The data transport interface serves multiple functions including normal data communication and test data transmission. By making the interface universal, the baseband chip structure remains simple without additional dedicated test leads, thereby reducing device complexity while maintaining testing capability.
3Volume of moving object
If the Bluetooth chip is integrated into the baseband chip, then the communication device achieves more functions with smaller size, but the testing becomes more complex requiring integration with existing data leads
Solution Approach 1:
The data transport interface is designed to handle both normal operational data and test data. This universal interface approach simplifies the testing arrangement for integrated chips by reusing existing communication paths rather than requiring separate test infrastructure, thereby reducing testing complexity despite the integrated architecture.
Solution Approach 2:
The switching mechanism dynamically reconfigures the data transport interface between operational mode and testing mode. During normal operation, the interface serves communication functions; during testing, it is dynamically switched to serve test equipment connection, allowing the same physical infrastructure to adapt to different functional requirements.
Data Source
AI summary
A communication device is provided, which includes: a baseband chip; a target test chip integrated into the baseband chip; an upper-layer processing unit corresponding to the target test chip; and at least one data transport interface and at least one data processing unit corresponding to the at least one data transport interface. The communication device further includes: a first switch, adapted to connect the target test chip with the at least one data transport interface or the upper-layer processing unit; a second switch, adapted to connect the at least one data transport interface with its corresponding data processing unit or the target test chip; and a test control unit, configured to control the first switch and the second switch to connect the data transport interface with the target test chip, so as to enable the communication device to test the target test chip.