BaTiO3 Dielectric Ceramic Composition for High Voltage Reliability
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Solution Overview
Problem
Existing dielectric ceramic compositions for multilayer ceramic capacitors used in medium-high voltage applications have low voltage resistance and insufficient lifetime characteristics, especially when downsized and high-capacity, necessitating improved reliability and performance.
Innovation Solution
A dielectric ceramic composition comprising BaTiO2, BaZrO2, and rare earth oxides, with specific X-ray diffraction peak intensity ratios, allowing for improved high-temperature accelerated lifetime while maintaining specific permittivity, capacitance-temperature characteristics, and voltage resistance, and using inexpensive base metals for internal electrodes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If dielectric ceramic composition is made thinner to downsize capacitors, then device size is reduced, but voltage resistance and lifetime characteristics deteriorate
Solution Approach 1:
The patent changes the chemical composition parameters of the dielectric ceramic by incorporating specific ratios of BaTiO3 (40-65 moles), ZrO2 (5-20 moles), and rare earth oxides (4-15 moles) to optimize the properties of thin dielectric layers, achieving both downsizing and maintained reliability
Solution Approach 2:
The patent creates a composite dielectric ceramic material combining multiple components (BaTiO3, ZrO2, and rare earth oxides such as La2O3, CeO2, Pr6O11, Nd2O3, Sm2O3, Eu2O3, Gd2O3, Tb4O7, Dy2O3, Ho2O3, Er2O3, Tm2O3, Yb2O3, or Lu2O3) to achieve superior voltage resistance and lifetime characteristics in thin-film structures
2Ease of manufacture
If conventional dielectric ceramic compositions are used, then manufacturing process is simple, but voltage resistance and lifetime characteristics are insufficient
Solution Approach 1:
The patent modifies the compositional parameters of conventional BaTiO3-based ceramics by adding controlled amounts of ZrO2 (5-20 moles) and rare earth oxides (4-15 moles) to improve voltage resistance and lifetime characteristics while maintaining compatibility with existing manufacturing processes
3Quantity of substance
If high-capacity capacitors are designed with more layers, then capacitance increases, but manufacturing complexity and reliability challenges increase
Solution Approach 1:
The patent optimizes the dielectric ceramic composition parameters to enable production of ultra-thin dielectric layers (10 μm or less) with high reliability, allowing increased layer count for higher capacitance without proportionally increasing manufacturing complexity or reducing voltage resistance
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The composition achieves high reliability and improved performance in thin dielectric layers for medium-high voltage applications, enabling downsized and high-capacity electronic devices with enhanced voltage resistance and extended lifespan.
Implementation Method 1
when the X-ray maximum intensity peak of the specific component has specific relation
Data Source
AI summary
The present invention relates to a dielectric ceramic composition comprising BaTiO3, BaZrO3, and the oxide of R wherein, when A is the content of BaZrO3, and C is the content of the oxide R, with respect to 100 moles of BaTiO3, then A is 40≦A≦65 moles and C is 4≦C≦15 moles; plus said dielectric composition satisfies the equation (1) and (2). The present invention can provide a dielectric ceramic composition good in IR lifetime, and capable to be suitably used for medium-high voltage which has a high rated voltage (for example, 100V or more).0.0038A−0.147≦B≦0.004A+0.04 Equation (1)(note that, B is a ratio of the X-ray diffraction maximum intensity among peaks of said BaZrO3 with respect to the X-ray diffraction maximum intensity among peaks of said BaTiO3).0.0041C−0.0115≦D≦0.0046C+0.084 Equation (2)(note that, D is a ratio of the X-ray diffraction maximum intensity among peaks of the oxide of said R with respect to the X-ray diffraction maximum intensity among peaks of said BaTiO3).