Multi-Cell Battery Fault Indicator IC for Rapid Comparator Testing
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Solution Overview
Problem
Current methods for testing multi-cell battery fault indicator ICs are inefficient and time-consuming, requiring individual component testing against multiple threshold voltages, which is costly and labor-intensive.
Innovation Solution
A multi-cell battery fault indicator IC is developed, incorporating comparators, logical AND and OR gates, and a multiplexer to efficiently test the IC's operation by forcing battery cells into fault conditions and verifying the IC's response, allowing for rapid verification of proper operation against multiple threshold voltages.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If individual component testing is performed against multiple threshold voltages, then testing thoroughness is improved, but testing time and cost increase significantly
Solution Approach 1:
The patent combines multiple comparator testing operations into a single integrated circuit device under test. Multiple comparators with different threshold voltages are merged into one IC, allowing simultaneous testing of all comparators in a single device rather than testing individual components separately against multiple thresholds.
Solution Approach 2:
The testing apparatus is designed to universally test multiple comparator types with different threshold voltages using a single test setup. The system can handle various threshold voltage levels (e.g., 4.2V, 4.35V, 4.45V) and multiple battery cell configurations without requiring separate testing equipment for each scenario.
2Reliability
If individual component testing is performed against multiple threshold voltages, then testing thoroughness is improved, but labor intensity increases
Solution Approach 1:
The patent merges multiple testing functions into a single automated test procedure. The testing apparatus automatically sequences through multiple threshold voltage comparisons and logic gate evaluations without requiring manual intervention for each test step, significantly reducing labor intensity.
Solution Approach 2:
The integrated circuit device performs self-testing by internally comparing multiple battery cell voltages against multiple threshold voltages simultaneously. The device autonomously evaluates fault conditions and generates test results without requiring external manual testing for each comparator.
3Measurement precision
If multiple comparators are tested separately, then individual comparator performance is verified, but testing efficiency decreases
Solution Approach 1:
The patent merges multiple comparator testing operations into a single simultaneous testing process. All comparators within the integrated circuit are tested together in one operation, maintaining precise verification of each comparator's performance while dramatically improving overall testing efficiency.
Solution Approach 2:
The testing process maintains continuous operation by simultaneously evaluating all comparators without interruption. The test apparatus continuously monitors multiple voltage comparisons and logic gate outputs in parallel, eliminating idle time between individual comparator tests.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and efficient bulk testing of large numbers of comparators and verification of the IC's operation, facilitating the identification of defective units and ensuring proper fault detection in electronic systems.
Implementation Method 1
a comparator coupled to the MUX and configured to compare a MUX output signal to a threshold voltage to provide a comparator output signal
Implementation Method 2
to use a logic AND gate to provide an AND gate output signal based on the stored comparator output signal
Data Source
AI summary
In some examples, apparatus comprises a multiplexer (MUX) adapted to be coupled to a set of battery cells and configured to provide a voltage of a different battery cell in the set of battery cells based on a MUX control signal. Apparatus comprises a comparator coupled to the MUX and configured to compare a MUX output signal to a threshold voltage to provide a comparator output signal. Apparatus comprises a digital control circuit configured to provide the MUX control signal to the MUX, to store the comparator output signal, and to use a logic AND gate to provide an AND gate output signal based on the stored comparator output signal.