Monolithic BAW Resonator Fabrication for Multi-Frequency Integration

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Solution Overview

Problem

Current radio frequency front-end elements, particularly in mobile devices, face challenges in miniaturization and cost-effectiveness due to the need for multiple frequency BAW resonators, which are typically achieved using piezoelectric resonators that require complex and costly photolithography processes.

Innovation Solution

A monolithic integrated BAW resonator production method utilizing an imprint template with varying die heights to create grooves on a substrate, allowing for the sequential stacking of electrode and piezoelectric layers of different thicknesses, enabling the formation of resonators with distinct frequencies on a single chip without the need for extensive photolithography, thus simplifying the process and reducing costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If multiple photolithography processes are used to form resonators of different frequencies, then manufacturing precision can be achieved, but device complexity and production costs increase

Engineering Contradiction:
Improveresonator frequency precisionVSAvoidphotolithography process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent segments the resonator formation process by creating separate etch holes for different resonator frequencies. Each etch hole is defined by a mask pattern with specific dimensions, allowing independent control of resonator thickness and frequency characteristics without requiring multiple photolithography steps on the same layer

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from two-dimensional photolithography patterning to three-dimensional structure definition by using varying etch hole depths. Different resonator frequencies are achieved by controlling the depth of etch holes in the substrate, adding a vertical dimension to the patterning process and eliminating the need for multiple photolithography layers

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Manufacturing precision

If multiple photolithography processes are used to form resonators of different frequencies, then manufacturing precision can be achieved, but production costs increase

Engineering Contradiction:
Improveresonator frequency precisionVSAvoidproduction cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent merges the patterning of multiple resonator types into a single photolithography step by using a composite mask pattern that defines all etch hole locations and dimensions. This consolidation maintains manufacturing precision while significantly reducing production costs by eliminating redundant photolithography processes

Inventive Principle:
Principle #5Merging (Combining)

3Volume of moving object

If BAW resonators of multiple frequencies are implemented on a single chip, then miniaturization is achieved, but manufacturing complexity increases

Engineering Contradiction:
Improvechip sizeVSAvoidproduction process complexity
Core Design Contradiction:
Volume of moving objectVSDevice complexity

Solution Approach 1:

The patent applies local quality by creating spatially varying etch hole characteristics (different depths, positions, and dimensions) across the substrate to accommodate different resonator frequencies. Each region of the substrate is locally optimized for its specific resonator type while maintaining a unified manufacturing process

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables the production of miniaturized, multi-band BAW resonators with improved production flexibility and reduced costs by directly defining resonator thicknesses and frequencies using imprinting technology, avoiding the complexity of multiple photolithography steps.

Implementation Method 1

Press the mask material layer in a direction of the substrate by using the imprint template, to form, on the mask material layer through imprinting, a plurality of mask grooves with depths consistent with heights of the imprint dies

Methodology Applied
Scientific EffectImprinting:

Implementation Method 2

Perform plasma etching on the substrate by using the mask material layer as a mask, to form, on a surface of the substrate, grooves that one-to-one correspond to positions of the several mask grooves

Methodology Applied
Scientific EffectPlasma etching: Plasma

Implementation Method 3

Form, in the several grooves, bottom electrode layers, piezoelectric layers, and top electrode layers that are sequentially stacked, to form resonators of different frequencies

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Data Source

PatentUS12028035B2Monolithic integrated BAW resonator production method
Publication Date: 2024.07.02 HUAWEI TECH CO LTD
  • US12028035B2 patent drawing
  • US12028035B2 patent drawing
  • US12028035B2 patent drawing

AI summary

This application provides a monolithic integrated BAW resonator production method, including: preparing an imprint template; forming a mask material layer on a substrate; pressing the mask material layer by using the imprint template in a direction of the substrate, to form a mask groove; performing plasma etching on the substrate by using the mask material layer, as a mask, that is used to form the mask groove, to form, on the substrate, grooves that one-to-one correspond to positions of several mask grooves; and forming, in the several grooves, bottom electrode layers, piezoelectric layers, and top electrode layers that are sequentially stacked, to form resonators of different frequencies.