BAW Resonator Wafer Layout With Multiple kt2 Coupling Coefficients

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Solution Overview

Problem

Conventional methods for adjusting electromechanical coupling coefficients (kt2) in bulk acoustic wave (BAW) resonators on a die or wafer often require uniform treatment of piezoelectric material layers, leading to increased die size and reduced yield, as they lack the ability to efficiently create resonators with varying kt2 values without increasing footprint.

Innovation Solution

Differentially treat piezoelectric material layers of shunt and series resonators through trimming, etching, or doping to achieve distinct kt2 values, allowing for multiple filters with different performance parameters on a single die, reducing die size and optimizing component layout.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If uniform treatment of piezoelectric material layers is applied to all resonators on a wafer, then manufacturing simplicity is maintained, but the ability to create resonators with varying kt2 values is lost, requiring increased die size to accommodate different filter requirements

Engineering Contradiction:
Improvevariation of kt2 valuesVSAvoiddifferential treatment process
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies local quality by treating different regions of the piezoelectric material layer differently - some regions receive trimming/etching to reduce thickness and create lower kt2 values, while other regions maintain original thickness for higher kt2 values. This spatial variation in material properties enables multiple resonator types on a single die without increasing overall die size.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent changes the physical parameter of piezoelectric material thickness in different regions to control kt2 values. By selectively reducing thickness in certain areas through trimming or etching, the electromechanical coupling coefficient is modified, enabling creation of resonators with different electrical characteristics from the same base structure.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If multiple filters with different passbands are integrated on a single die, then filter density is enhanced and die size is minimized, but the manufacturing process complexity increases due to required selective treatments

Engineering Contradiction:
Improvefilter densityVSAvoidselective trimming and etching
Core Design Contradiction:
ProductivityVSEase of manufacture

Solution Approach 1:

The patent segments the piezoelectric material layer into different regions with distinct thicknesses and kt2 values. By dividing the uniform layer into zones that will form different resonator types, the manufacturing process can create multiple filter functionalities simultaneously without requiring separate fabrication runs for each filter type.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs preliminary trimming or etching of the piezoelectric material layer before completing the resonator fabrication process. This advance modification of material thickness in specific regions allows subsequent processing steps to create multiple resonator types from a single prepared substrate, improving manufacturing efficiency.

Inventive Principle:
Principle #10Preliminary action

3Adaptability or versatility

If resonators with different kt2 values are created by adding separate piezoelectric layers, then kt2 variation is achieved, but die size increases and component layout becomes less efficient

Engineering Contradiction:
Improvekt2 value diversityVSAvoiddie size
Core Design Contradiction:
Adaptability or versatilityVSArea of stationary object

Solution Approach 1:

The patent merges multiple resonator functionalities into a single integrated structure by creating lateral variations in the piezoelectric material layer. Instead of stacking separate layers for different kt2 values, the invention combines different thickness regions within the same layer plane, achieving kt2 diversity while maintaining a compact footprint.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent transitions from vertical layering (adding thickness in the Z-dimension) to lateral variation (changing thickness in the X-Y plane). By modifying the piezoelectric material thickness across different horizontal regions rather than adding separate vertical layers, the invention achieves kt2 diversity without increasing die area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the fabrication of multiple filters with diverse passbands on a single die, minimizing die size and enhancing filter density, while maintaining optimal component placement and reducing parasitics.

Implementation Method 1

each of the plurality of bulk acoustic wave resonators including a piezoelectric material film

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Data Source

PatentUS20250309863A1Multiple electromechanical coupling coefficients on same wafer
Publication Date: 2025.10.02 SKYWORKS GLOBAL PTE LTD
  • US20250309863A1 patent drawing
  • US20250309863A1 patent drawing
  • US20250309863A1 patent drawing

AI summary

Aspects and embodiments disclosed herein include a radio frequency filter comprising a plurality of series bulk acoustic wave resonators and a plurality of shunt bulk acoustic wave resonators, at least one of the plurality of shunt bulk acoustic wave resonators exhibiting a different electromechanical coupling coefficient than at least one of the plurality of series bulk acoustic wave resonators, at least one of the bulk acoustic wave resonators exhibiting a higher electromechanical coupling coefficient than another one of the bulk acoustic wave resonators having a thicker piezoelectric material layer stack than the another one of the bulk acoustic wave resonators.