BAW Resonator Thick Electrodes for Symmetric Acoustic Impedance

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Solution Overview

Problem

Conventional RF technologies face limitations in achieving high performance bulk acoustic wave resonators for frequencies above 5 GHz due to the degradation of polycrystalline piezoelectric films, and challenges in manufacturing single crystal piezoelectric thin films for improved resonator devices.

Innovation Solution

An anti-symmetrical configuration for bulk acoustic wave resonator devices with partial mass-loaded structures on both electrodes, using materials like molybdenum, ruthenium, and aluminum-copper, to achieve a symmetric acoustic impedance profile and lower electrical resistance, enhancing the Q factor and compatibility with arbitrary resonator shapes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If polycrystalline piezoelectric thin films are used for BAW resonators, then manufacturing is easier and cost is lower, but the quality degrades quickly as thickness decreases below 0.5 um, limiting operation at frequencies around 5 GHz and above

Engineering Contradiction:
Improveease of manufactureVSAvoidfilm quality
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent employs asymmetric electrode thickness design where the first electrode has a different thickness profile than the second electrode. Specifically, the first electrode has a mass-loaded region with greater thickness than its non-loaded region, while the second electrode has the opposite configuration. This asymmetric design compensates for the inherent asymmetries in the piezoelectric film structure and achieves symmetric acoustic impedance, thereby improving Q factor and enabling operation at frequencies above 5 GHz while maintaining manufacturing feasibility with polycrystalline films

Inventive Principle:
Principle #4Asymmetry

2Reliability

If single crystal piezoelectric thin films are used to maintain quality at very thin thicknesses, then resonator performance improves for frequencies around 5 GHz and above, but manufacturing challenges and transfer difficulties increase

Engineering Contradiction:
Improvefilm qualityVSAvoidease of manufacture
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent applies local quality modification by introducing mass-loaded regions with different thicknesses at specific locations of the electrodes. Rather than requiring uniform high-quality single crystal films throughout, the invention uses localized thickness variations in the electrodes to compensate for polycrystalline film limitations. This allows the use of easier-to-manufacture polycrystalline films while achieving performance comparable to or exceeding single crystal films through strategic local structural modifications

Inventive Principle:
Principle #3Local quality

3Adaptability or versatility

If conventional RF technology is used, then current applications are supported, but performance limitations prevent achievement of high performance at frequencies above 5 GHz

Engineering Contradiction:
Improvefrequency rangeVSAvoidperformance
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent changes critical physical parameters of the resonator structure, specifically the electrode thicknesses and the introduction of mass-loaded regions. By adjusting these geometric parameters, the acoustic impedance profile is modified to achieve symmetry, which directly improves the Q factor. This parameter optimization enables the resonator to operate effectively at frequencies above 5 GHz, expanding the frequency range while maintaining high performance that conventional designs cannot achieve

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The anti-symmetrical configuration provides improved Q factor and reduced misalignment issues, achieving a symmetric acoustic impedance profile and lower electrical resistance, enabling high performance at resonance frequencies while being cost-effective and compatible with conventional manufacturing methods.

Implementation Method 1

a piezoelectric layer (220) formed overlying a substrate member (210). A front-side electrode (230) is formed overlying the piezoelectric layer (220), while a back-side electrode (240) is formed underlying the piezoelectric layer (220)

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Data Source

PatentUS10879872B2BAW resonators with antisymmetric thick electrodes
Publication Date: 2020.12.29 AKOUSTIS TECHNOLOGIES CORP
  • US10879872B2 patent drawing
  • US10879872B2 patent drawing
  • US10879872B2 patent drawing

AI summary

A resonator circuit device. This device can include a piezoelectric layer having a front-side electrode and a back-side electrode spatially configured on opposite sides of the piezoelectric layer. Each electrode has a connection region and a resonator region. Each electrode also includes a partial mass-loaded structure configured within a vicinity of its connection region. The front-side electrode and the back-side electrode are spatially configured in an anti-symmetrical manner with the resonator regions of both electrodes at least partially overlapping and the first and second connection regions on opposing sides. This configuration provides a symmetric acoustic impedance profile for improved Q factor and can reduce the issues of misalignment or unbalanced boundary conditions associated with conventional single mass-loaded perimeter configurations.