BCD Variable Resistance Apparatus for Power Supply Testing
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Solution Overview
Problem
Existing devices for testing electrical power supplies, such as decade boxes and potentiometers, are limited by their manual switching designs, which require significant user input and are not suitable for high-power applications, leading to imprecise control over load resistance.
Innovation Solution
A variable resistance apparatus using a binary-coded decimal scheme with multiple resistive elements and switches, allowing for automatic switching to provide a wide range of resistances, enabling precise and efficient testing of power supplies across various electrical conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If manual switching devices (decade boxes, potentiometers) are used to provide variable resistance, then the device structure is simple, but the ease of operation deteriorates due to significant user input required and imprecise control
Solution Approach 1:
The patent replaces manual mechanical switching with electronic control. A microcontroller automatically actuates electronic switches (such as MOSFETs or relays) to connect or disconnect resistive elements based on a desired resistance value input through a simple interface, eliminating the need for manual switching while maintaining structural simplicity.
Solution Approach 2:
The system performs self-service by automatically calculating and configuring the resistance network. When a user inputs a desired resistance value, the microcontroller automatically determines which resistive elements to connect and actuates the appropriate switches without requiring user knowledge of the underlying resistance configuration.
2Productivity
If manual switching devices are used for testing power supplies, then the device complexity is low, but the productivity deteriorates due to significant user input required to test at several voltages
Solution Approach 1:
The system implements periodic automated testing by programming the microcontroller to sequentially test the power supply at multiple voltage and resistance conditions. The microcontroller automatically cycles through predetermined test parameters, actuating switches to configure different resistance values and measuring the power supply response at each condition, thereby increasing productivity through systematic repeated testing.
Solution Approach 2:
The test sequence and resistance values are pre-programmed into the microcontroller before testing begins. This preliminary configuration allows the system to automatically execute a comprehensive test routine without requiring user input during the actual testing process, significantly improving productivity.
3Reliability
If decade boxes or potentiometers are used for high-power applications, then the device structure is simple, but the reliability deteriorates because they are not designed for high-power conditions
Solution Approach 1:
The patent segments the resistance function into multiple discrete resistive elements (such as power resistors) that are each capable of handling high power. These elements are connected through electronically controlled switches, allowing the system to distribute high current across multiple parallel resistors when low resistance is required, thereby managing power dissipation and improving reliability in high-power applications.
Solution Approach 2:
The system achieves multi-functionality by using a single apparatus that can reliably handle various power levels and resistance values. The combination of power-rated resistive elements with electronic switching and control allows the device to function reliably across a wide range of conditions that would overload traditional decade boxes or potentiometers.
Data Source
AI summary
An embodiment of an apparatus for providing a variable resistance may be configured to provide a resistance value according to a binary-coded decimal scheme. The apparatus may be referred to herein as a BCD variable resistance apparatus. The BCD variable resistance apparatus may include a plurality of resistive elements and a plurality of switches. In an embodiment, the resistive elements may be coupled with respective switches in a binary-coded decimal scheme.