Bead Width Correction for Additive Manufacturing Path Overlap

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional control information generation devices for additive manufacturing face challenges in maintaining manufacturing quality due to bead overlap on the inner side of the manufacturing path, particularly at corners and areas with changing path directions, leading to reduced accuracy and uneven material distribution.

Innovation Solution

A control information generation device that includes a bead width correction unit, path correction unit, and control information output unit to generate corrected manufacturing paths and widths, ensuring beads are adjacent without overlapping, thereby improving manufacturing quality by adjusting the path and bead height based on curvature and surface tension considerations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Shape

If the overlap ratio between beads is set to ensure flatness on the upper surface of a layer, then the flatness is improved, but bead overlap occurs on the inner side of the manufacturing path causing manufacturing quality to deteriorate

Engineering Contradiction:
Improveflatness of upper surfaceVSAvoidmanufacturing quality
Core Design Contradiction:
ShapeVSManufacturing precision

Solution Approach 1:

The patent applies local quality by differentiating the treatment of beads based on their position in the manufacturing path. Beads on the inner side of the path (where overlap occurs) are treated differently from beads on the outer side. The system calculates a curvature-based correction value and selectively adjusts the added amount of processing material only for beads located on the inner side, rather than uniformly adjusting all beads. This localized approach resolves the contradiction by maintaining flatness where needed while preventing quality deterioration from overlap in specific regions.

Inventive Principle:
Principle #3Local quality

2Shape

If the added amount of processing material is adjusted to maintain flatness in areas with non-specific overlap ratios, then flatness is improved, but uneven material distribution occurs leading to reduced manufacturing quality

Engineering Contradiction:
ImproveflatnessVSAvoidmanufacturing quality
Core Design Contradiction:
ShapeVSManufacturing precision

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the added amount of processing material based on the curvature of the manufacturing path. A curvature calculation unit computes the curvature at each position, and a correction value calculation unit generates correction values proportional to the curvature. The control information generation unit then modifies the added amount parameter selectively for beads on the inner side of the path where overlap occurs, rather than applying uniform adjustments. This parameter-based approach ensures flatness is maintained while preventing uneven material distribution that would degrade manufacturing quality.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11480947B2Control information generation device and control information generation method for controlling an additive manufacturing apparatus using bead width correction
Publication Date: 2022.10.25 MITSUBISHI ELECTRIC CORP
  • US11480947B2 patent drawing
  • US11480947B2 patent drawing
  • US11480947B2 patent drawing

AI summary

A control information generation device generates control information for controlling an additive manufacturing apparatus that manufactures a layer shape using a bead that is a manufactured object formed by adding a molten processing material to a target surface while moving a processing position along a manufacturing path, and manufactures a three-dimensional shape in which the layer shapes are stacked. The device includes: a bead width correction unit that obtains a corrected width on the basis of the manufacturing path and a reference width of a cross section of the bead, the corrected width being a width of the cross section for allowing the beads to be adjacent to each other without overlapping; a path correction unit that obtains a corrected path on the basis of the manufacturing path and the corrected width; and a control information output unit that outputs control information indicating the corrected path and the corrected width.