Beam Adjustment Device Using Calibration Sample for Microscope Alignment
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Solution Overview
Problem
High and extremely high resolution microscopes require precise beam adjustments that are currently impractical due to stringent accuracy and mechanical drift issues, making manual adjustments time-consuming and limited to experienced personnel, and necessitating frequent recalibration and sample removal, which hampers long-term measurements.
Innovation Solution
A device and method allowing for independent beam adjustment using a calibration sample that can be inserted and removed from the illumination path to check and adjust the pupil and focal positions of beams, utilizing a motorized actuating element, such as a tiltable mirror, to align beams without disturbing the sample, enabling long-term examinations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual beam adjustment is performed to achieve precise alignment, then beam alignment accuracy is improved, but adjustment time and operational complexity increase significantly
Solution Approach 1:
A calibration sample with a known structure (such as a grid or pattern) is introduced as an intermediary object into the optical path. This calibration sample provides reference features that enable automatic detection and calculation of beam misalignment, replacing the need for manual visual adjustment and significantly reducing adjustment time while maintaining high precision.
Solution Approach 2:
The manual mechanical adjustment process is replaced by an automated optical measurement and control system. The system uses detectors to capture images of the calibration sample, processes the images computationally to determine beam positions, and automatically adjusts beam alignment based on calculated deviations, eliminating manual intervention.
2Measurement precision
If manual beam adjustment is performed by experienced personnel to achieve precise alignment, then beam alignment accuracy is improved, but ease of operation deteriorates
Solution Approach 1:
The system performs self-calibration and self-adjustment by automatically detecting beam positions using the calibration sample and autonomously calculating and implementing correction actions. This eliminates the need for skilled operators to perform manual adjustments, making the system easy to operate for users regardless of their expertise level.
Solution Approach 2:
The system continuously monitors beam positions by detecting images of the calibration sample and provides feedback to the control system. Based on this feedback, the system automatically adjusts beam alignment to maintain optimal positioning, creating a closed-loop control system that is both precise and easy to operate.
3Measurement precision
If sample removal is performed to enable beam adjustment, then beam alignment accuracy is improved, but measurement continuity deteriorates
Solution Approach 1:
The calibration process is segmented from the actual measurement process. The calibration sample is used only during initial setup and periodic recalibration, while the actual sample remains in place for continuous measurement. This segmentation allows alignment adjustments to be made without removing the measurement sample, maintaining measurement continuity.
Solution Approach 2:
A separate calibration sample serves as an intermediary reference object that can be independently introduced and removed from the optical path without affecting the measurement sample. This intermediary calibration sample enables alignment verification and adjustment while the actual measurement sample remains undisturbed in the measurement position.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable and precise beam alignment during microscope operation, reducing the need for skilled personnel and allowing continuous measurements by maintaining beam alignment without sample removal, achieving sub-nanometer accuracy in image offset correction.
Implementation Method 1
utilizing a motorized actuating element, such as a tiltable mirror, to align beams
Data Source
AI summary
A device for beam adjustment in an optical beam path, having at least two mutually independent light sources providing respective beams of a high or extremely high resolution microscope, the beams of the light sources superposed in a common illumination beam path. The device includes a calibration sample with the aid of which the pupil position and/or focal position of the beams can be checked. The device also includes a sample holder arranged to bring the calibration sample into and out of the common illumination beam path at the site or in the vicinity of an intermediate image. A corresponding method is described. In accordance with the device and method, it is possible to undertake the beam adjustment independently of the actual use, that is to say, in the case of a high resolution microscope, independently of the examination sample and/or the recording of images.