Charged Particle Beam Device Electrostatic Chuck State Detection

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Solution Overview

Problem

The accuracy of measurement and processing in charged particle beam devices is affected by the state of the object, including distortion, clogging of foreign matter, and oxide films, which existing technologies do not adequately address by considering the object's state during measurement and processing.

Innovation Solution

A charged particle beam device equipped with an electrostatic chuck, a first voltage generation unit, and a state determination unit that includes a current waveform simulation unit, difference integration unit, and determination unit to assess the object's state based on the integration value of differences between simulated and actual electrostatic chuck currents, improving measurement and processing accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the electrostatic chuck is used to adsorb the inspection object, then the object can be held for measurement and processing, but the accuracy of measurement and processing deteriorates when the object is in abnormal states such as distortion, clogging of foreign matter, or oxide film formation

Engineering Contradiction:
Improveobject adsorption stabilityVSAvoidmeasurement and processing accuracy
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The system performs preliminary determination of the object's state (checking for distortion, foreign matter clogging, oxide films) before measurement and processing. By using the electrostatic chuck current characteristics to detect abnormalities in advance, the system can identify problematic objects before they affect measurement accuracy, allowing for preventive actions such as removing the object or adjusting measurement parameters.

Inventive Principle:
Principle #10Preliminary action

2Device complexity

If the state of the object is not considered during measurement and processing, then the measurement process can be simplified, but the accuracy of measurement and processing deteriorates due to undetected abnormalities

Engineering Contradiction:
Improvemeasurement process complexityVSAvoidmeasurement and processing accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The system incorporates feedback by continuously monitoring the electrostatic chuck current and comparing it against simulated reference values. This feedback mechanism automatically determines the object's state (normal, distorted, clogged, or oxidized) and provides information that can be used to adjust the measurement process, thereby maintaining accuracy without significantly increasing operational complexity.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If pulse current measurement is performed to determine object state, then object abnormalities can be detected, but additional measurement steps and processing time are required

Engineering Contradiction:
Improveobject state detection accuracyVSAvoidmeasurement and processing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system merges the object state determination process with the existing electrostatic chuck operation. The pulse current measurement is integrated into the normal chucking process, allowing state detection to occur during or immediately after the object is adsorbed, rather than as a separate preliminary step. This integration minimizes additional time requirements while maintaining detection accuracy.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables the determination of object abnormalities such as clogging and distortion, allowing for adjustments to be made, thereby enhancing the accuracy of measurement and processing even when the object is in an abnormal state.

Implementation Method 1

an electrostatic chuck that adsorbs an inspection object

Methodology Applied
Scientific EffectElectrostatic adsorption: Electrostatics

Data Source

PatentUS11694871B2Charged particle beam device
Publication Date: 2023.07.04 HITACHI HIGH TECH CORP
  • US11694871B2 patent drawing
  • US11694871B2 patent drawing
  • US11694871B2 patent drawing

AI summary

Provided is a charged particle beam device capable of improving the accuracy of measurement and processing. The charged particle beam device includes an electrostatic chuck that adsorbs an inspection object, a voltage generation unit that generates a voltage to be supplied to the electrostatic chuck, and a state determination unit that determines a state of the inspection object. Here, the state determination unit includes a current waveform simulation unit that simulates a time-series change of an electrostatic chuck current flowing through the voltage generation unit when the electrostatic chuck normally adsorbs the inspection object, a difference integration unit that acquires an integration value of a difference between a time-series change of a simulation current generated by the current waveform simulation unit and the time-series change of the electrostatic chuck current flowing through the voltage generation unit, and a difference determination unit that determines an adsorption state of the inspection object and a shape feature of the inspection object based on the integration value of the difference.