Beam Control Channel for mmW Device Testing
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Solution Overview
Problem
Current methods for testing modern communication devices with beamforming functions, particularly in mmW systems, are cost-intensive and inefficient due to the complexity of calibration and replicability issues in over-the-air chambers, and previous approaches result in slow processing of beam control signals.
Innovation Solution
A test system and method that establish a beam control channel between the device under test and a testing device, using a transposed combined channel matrix to adapt test signals, ensuring efficient beamforming simulation by applying the transposed beamforming matrix of the device under test and the emulated entity, thereby reducing testing time and costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If over-the-air chambers are used for mmW system end-to-end testing, then wireless beamforming testing can be performed, but the testing becomes cost-intensive and suffers from calibration and replicability problems
Solution Approach 1:
The patent introduces an intermediary testing device that acts as a bridge between the device under test and the emulated entity. This testing device receives beam control signals from the device under test, applies the transposed combined channel matrix to adapt test signals, and generates appropriate test responses. This intermediary approach eliminates the need for complex over-the-air chambers while maintaining wireless beamforming testing capability.
Solution Approach 2:
The patent creates a virtual copy of the wireless communication environment by emulating an entity (such as a base station or user equipment) within the testing device. Instead of requiring physical over-the-air chambers with real wireless propagation paths, the system uses digital signal processing to copy and simulate the expected wireless channel behavior through channel matrices, thereby simplifying the physical testing infrastructure.
2Device complexity
If beamforming function is moved to channel emulator for mmW testing, then testing can be performed without over-the-air chambers, but testing duration increases resulting in high costs
Solution Approach 1:
The patent applies the transposed combined channel matrix in advance to adapt test signals before they are transmitted to the device under test. By pre-processing the test signals with the appropriate channel characteristics and beamforming weights, the system eliminates the need for time-consuming iterative calibration and measurement procedures during actual testing, thereby significantly reducing testing duration while maintaining setup simplicity.
3Ease of manufacture
If classical cable-based system end-to-end testing is used, then connection is straightforward, but it is not feasible for mmW systems due to tight integration of antenna elements
Solution Approach 1:
The patent replaces the mechanical cable-based connection system with an electromagnetic signal processing approach. Instead of physically connecting the device under test through cables to external testing equipment, the system uses wireless electromagnetic signals and digital signal processing (applying channel matrices and beamforming weights) to achieve the same end-to-end testing functionality. This substitution enables mmW system compatibility while maintaining testing effectiveness.
Data Source
AI summary
A test system for testing a device under test comprises a testing device and a device under test. A beam control channel is established between the device under test and the testing device, via which a respective beam of the device under test to be applied is controlled such that beamforming of the device under test is carried out in the testing device. The testing device applies a transposed combined channel matrix, wherein the transposed combined channel matrix encompasses a transposed beamforming matrix of the device under test, a transposed channel matrix and a transposed beamforming matrix of an entity emulated by the testing device. Further, a method of testing a device under test is described.