Charged Particle Beam Interference Imaging for Long-Range 3D Focus
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Solution Overview
Problem
Current imaging systems using charged particles are limited in focusing a beam to a three-dimensional focal point beyond 10 centimeters from the source, restricting their application in imaging and treating patients, particularly for proton beams used in cancer treatment.
Innovation Solution
A system employing electrostatically charged cone-shaped and annular reflectors to focus charged particle beams, allowing them to be directed and intercepted to form interference zones, creating Fresnel fringes that enable imaging and treatment up to a meter from the source, with the ability to tune the reflectors to match the charge of the particles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of stationary object
If conventional electrostatic beam deflectors are used, then the system can operate with simple components, but the beam cannot be focused to a three-dimensional focal point beyond 10 centimeters from the source
Solution Approach 1:
The system segments the beam focusing function into multiple electrostatic reflectors (first reflector, second reflector, third reflector) that work in sequence. Each reflector contributes to a portion of the beam manipulation, enabling the cumulative effect of achieving a three-dimensional focal point at distances greater than 10 cm, which cannot be achieved with a single conventional deflector.
Solution Approach 2:
The invention transitions from two-dimensional beam deflection to three-dimensional focal point formation by introducing multiple reflectors arranged in a specific spatial configuration. The first reflector creates a virtual source, the second reflector further manipulates the beam path, and the third reflector focuses the beam to a three-dimensional focal point, adding spatial dimensionality to the beam control.
2Manufacturing precision
If the reflectors are tuned to match the charge of the particles, then the focusing effectiveness is improved, but the system requires more complex tuning and adjustment mechanisms
Solution Approach 1:
The system employs adjustable electrostatic potentials on each reflector surface, allowing the electrical parameters to be tuned to match the charge characteristics of the charged particle beam. This parameter adjustment enables optimization of the focusing precision for different beam types (electrons, ions, protons) while maintaining the same physical reflector structure.
Solution Approach 2:
The electrostatic reflectors incorporate adjustable voltage sources that allow dynamic tuning of the reflector charges during operation. This dynamic adjustment capability enables the system to adapt to different charged particle beam conditions and optimize focusing precision without requiring physical reconfiguration of the reflector geometry.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the generation of a focused three-dimensional charged particle beam that can be used for imaging and treatment at distances up to a meter, improving the range and effectiveness of charged particle imaging systems, including proton beams for cancer treatment.
Implementation Method 1
A system employing electrostatically charged cone-shaped and annular reflectors to focus charged particle beams
Implementation Method 2
an annular electrostatically charged reflector charged and positioned to reflect the first reflected beam to provide a second reflected beam and to focus the second reflected beam to a three-dimensional probe
Implementation Method 3
allowing them to be directed and intercepted to form interference zones, creating Fresnel fringes that enable imaging and treatment up to a meter from the source
Implementation Method 4
creating Fresnel fringes that enable imaging and treatment up to a meter from the source
Data Source
AI summary
A method of imaging an object in a first material having a different charge density to the object is provided, the method comprising: focusing a charged particle beam to a virtual charged particle beam source in the first material; moving the virtual charged particle beam source in and around the object to provide at least one charged particle reflected object beam or at least one charged particle refracted object beam and at least one charged particle bypass beam, wherein the charged particle reflected object beam or the charged particle refracted object beam and the charged particle bypass beam intercept one another to form an interference zone; and defocusing the interference zone to provide a Fresnel fringe, the Fresnel fringe forming an image of the object; or focusing the virtual charged particle beam source on the object to provide a first lower energy charged particle beam and a second lower energy charged particle beam, wherein the first lower energy charged particle beam and the second lower energy charged particle beam intercept one another to form a self-interference zone; defocusing the self-interference zone to provide a Fresnel fringe, the Fresnel fringe forming an image of the object.