Beam Profiler Calibration Using Integrating Sphere Illumination

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Solution Overview

Problem

There is no industry standard for certifying and calibrating beam profilers, leading to uncertainty about their accuracy in characterizing laser beam profiles over time and across different conditions.

Innovation Solution

A calibration tool using an integrating sphere to generate diffuse laser light uniformly scattered across a beam sensor's pixels, allowing for pixel-by-pixel certification and calibration based on comparisons with expected intensity values.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If beam profilers are used without industry standard calibration, then device complexity is reduced and ease of operation is improved, but measurement precision deteriorates due to uncertainty about accuracy

Engineering Contradiction:
Improvebeam profile measurement accuracyVSAvoidcalibration system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

An integrating sphere is introduced as an intermediary device to generate uniformly scattered light that serves as a reference standard for calibrating beam profiler pixels. The sphere receives laser light and scatters it uniformly across its internal surface, providing a known illumination pattern that mediates between the laser source and the beam profiler sensor array, enabling accurate calibration without requiring complex direct measurement setups

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The calibration process utilizes controlled changes in light intensity parameters by adjusting laser power levels and measuring the corresponding responses from individual pixels. By varying the illumination intensity and recording pixel responses at different levels, the system establishes calibration curves that correct for non-linearities and sensitivity variations across the sensor array, thereby improving measurement precision through parameter-based correction

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If pixel-by-pixel calibration is performed using uniformly scattered light, then measurement precision is improved through compensation for pixel response variations, but device complexity increases due to the calibration setup

Engineering Contradiction:
Improvepixel response uniformityVSAvoidcalibration tool structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The integrating sphere acts as a mediating optical element that transforms directional laser light into uniformly scattered illumination. This intermediary device simplifies the calibration process by providing a ready-made uniform light field that eliminates the need for complex mechanical scanning or multiple light sources, allowing direct pixel-by-pixel characterization through a single static measurement configuration

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The integrating sphere serves multiple functions simultaneously: it acts as a light source, a diffuser, a spatial uniformity generator, and a reference standard all in one device. This multi-functional approach replaces what would otherwise require separate components for each function, reducing overall system complexity while achieving the goal of uniform illumination across all pixels for comprehensive calibration

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures accurate and consistent beam profiling by compensating for variations in pixel responses, enabling robust calibration across varying conditions and extending the lifespan of beam profilers.

Implementation Method 1

an integrating sphere configured to receive the laser light and uniformly scatter the laser light off of an internal surface of the integrating sphere to generate diffuse laser light having a uniform spatial distribution

Methodology Applied
Scientific EffectDiffuse scattering: Scattering

Data Source

PatentUS20250327740A1Beam profiler certification and calibration
Publication Date: 2025.10.23 THE BOEING CO
  • US20250327740A1 patent drawing
  • US20250327740A1 patent drawing
  • US20250327740A1 patent drawing

AI summary

A calibration tool for a beam profiler is disclosed. The calibration tool includes an integrating sphere configured to receive laser light emitted from a laser and generate diffuse laser light. A sensor system is configured to output an expected intensity value of the diffuse laser light. An interface is configured to align a beam profiler with the integrating sphere to direct the diffuse laser light to be incident on an array of pixels of a beam sensor of the beam profiler. The array of pixels of the beam sensor is configured to output a plurality of native intensity values of the diffuse laser light. A computing system is configured to calibrate the beam profiler based at least on differences between the plurality of native intensity values of the diffuse laser light and the expected intensity value of the diffuse laser light.