Charged Particle Beam Writing Apparatus Dose Equation Selection

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Solution Overview

Problem

Conventional electron beam writing methods require longer writing times due to excessive doses in regions far from the figure edge, as they do not adequately account for dose distribution beyond the forward scattering radius, leading to inefficient pattern writing and increased irradiation time.

Innovation Solution

A beam writing apparatus and method that select a dose equation for each small region of a target workpiece, virtually divided into mesh-like areas, to calculate and adjust the dose, reducing excessive doses and improving throughput by shortening writing time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a single dose equation is used for calculating beam dose across the entire writing region, then the calculation method is simple and easy to implement, but the dose distribution becomes non-optimized leading to excessive doses in inner figure regions and longer writing time

Engineering Contradiction:
Improveease of dose calculationVSAvoidwriting speed
Core Design Contradiction:
Ease of manufactureVSProductivity

Solution Approach 1:

The writing region is divided into multiple small regions (e.g., 3x3 grid) and different dose equations are applied to different regions. Inner figure regions use one dose equation while outer regions use another, allowing optimized dose calculation for each area rather than using a single equation for the entire region.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different dose equations are selected based on the local characteristics of each small region. The dose calculation method is adapted to match the specific requirements of inner figure regions versus outer regions, achieving local optimization of dose distribution and writing efficiency.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If the dose is set to ensure threshold value at figure edge, then pattern resolution is maintained, but regions sufficiently distant from figure edge receive excessive dose causing longer irradiation time

Engineering Contradiction:
Improvepattern resolutionVSAvoidirradiation time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The dose equation selection is based on local position characteristics. Inner figure regions use a dose equation optimized for maintaining pattern resolution at edges, while outer regions sufficiently distant from figure edges use a different equation that reduces excessive dose and shortens irradiation time.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent applies partial optimization by using different dose strategies for different regions. Full dose is applied where needed for pattern resolution at figure edges, while reduced dose is applied in outer regions where full dose is not necessary, avoiding excessive irradiation time.

Inventive Principle:
Principle #16Partial or excessive action

3Productivity

If dose equations are optimized for different regions, then writing time is reduced and throughput is enhanced, but the system complexity increases due to multiple dose equations and region division

Engineering Contradiction:
Improvewriting throughputVSAvoiddose calculation system complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The writing region is segmented into a grid of small regions (e.g., 3x3 division), with each region assigned a specific dose equation. This systematic segmentation provides a structured approach to managing multiple dose equations, balancing complexity with implementability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system dynamically selects appropriate dose equations based on the characteristics of each small region. This dynamic adaptation allows the system to optimize dose calculation for each region while maintaining a unified overall control framework, managing complexity through adaptive selection rather than fixed complex algorithms.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS8791432B2Charged particle beam writing apparatus and charged particle beam writing method
Publication Date: 2014.07.29 NUFLARE TECH INC
  • US8791432B2 patent drawing
  • US8791432B2 patent drawing
  • US8791432B2 patent drawing

AI summary

A beam writing apparatus according to an embodiment includes a selection unit configured to select a dose equation from a plurality of dose equations for calculating a dose of a beam, for each small region of a plurality of small regions made by virtually dividing a writing region of a target workpiece into mesh-like regions, a dose calculation unit configured to calculate a dose of a beam which is shot into a small region of the plurality of small regions, by using a selected dose equation, for the each small region, and a writing unit configured to write a desired pattern in the small region, by using a calculated dose, for the each small region.