Charged Particle Beam Writing Apparatus Mesh Parameter Exchange

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Solution Overview

Problem

The existing charged particle beam writing apparatuses face significant processing time challenges when performing mirror or rotation processing on semiconductor chip data, requiring extensive changes to arrangement coordinates and figure patterns, which prolongs the estimation and execution of writing times due to the need for extensive data processing.

Innovation Solution

The apparatus employs a map generation unit to divide the chip region into mesh areas, allowing for the exchange of parameters defined for each mesh region, thereby reducing processing time by directly corresponding and updating parameters for figure patterns undergoing reversal or rotation processing, and uses a writing unit to write these patterns with a charged particle beam.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If mirror processing or rotation processing is performed on chip data to change arrangement coordinates and figure patterns, then the writing apparatus can accommodate design variations and perform different writing operations, but the processing time becomes extremely long due to the enormous number of cells and figure patterns requiring modification

Engineering Contradiction:
Improveability to perform mirror processing and rotation processingVSAvoiddata processing time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The patent divides the chip data into multiple mesh regions (first mesh region, second mesh region, etc.) and processes each region independently. Instead of modifying all cell and figure pattern data throughout the entire chip, the invention segments the processing task by identifying only the affected mesh regions when mirror or rotation processing is requested, thereby dramatically reducing the amount of data that needs to be modified.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent pre-calculates and stores arrangement coordinates and figure pattern data for each mesh region before mirror or rotation processing is needed. When processing is required, the system simply exchanges the pre-stored data between mesh regions rather than performing extensive real-time calculations on all chip data, thus reducing processing time.

Inventive Principle:
Principle #10Preliminary action

2Manufacturing precision

If all cell data and figure pattern data are modified for mirror processing or rotation processing, then the correct writing pattern is achieved, but the estimation of writing time must wait for completion of this extensive data processing

Engineering Contradiction:
Improveaccuracy of writing patternVSAvoidtime for estimating writing time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent segments the chip into multiple mesh regions and only processes the specific regions affected by mirror or rotation operations. This allows the system to quickly identify and modify only the necessary portions of the data, maintaining writing accuracy while enabling rapid estimation of total writing time without waiting for complete data processing.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent creates and exchanges copies of arrangement coordinates and figure pattern data between mesh regions when mirror or rotation processing is performed. Instead of modifying the original data extensively, the system generates transformed copies for the affected regions, which maintains data integrity and speeds up the processing required for writing time estimation.

Inventive Principle:
Principle #26Copying

3Ease of operation

If the number of shots and writing time are estimated before writing, then users can plan and schedule writing operations, but the estimation process becomes extremely time-consuming when mirror processing or rotation processing is required

Engineering Contradiction:
Improveability to estimate writing time beforehandVSAvoidprocessing time for estimation
Core Design Contradiction:
Ease of operationVSLoss of time

Solution Approach 1:

The patent divides the writing time estimation process into segments corresponding to different mesh regions. When mirror or rotation processing is involved, the system estimates writing time for each affected mesh region independently using pre-calculated data, then sums these estimates. This segmented approach allows rapid preliminary estimation without requiring complete processing of all chip data.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs preliminary calculations and stores arrangement coordinates and figure pattern data for each mesh region in advance. This preliminary preparation enables the system to quickly generate writing time estimates by simply exchanging pre-computed data between mesh regions when mirror or rotation operations are requested, rather than performing extensive real-time calculations.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS9117632B2Charged particle beam writing apparatus and charged particle beam writing method
Publication Date: 2015.08.25 NUFLARE TECH INC
  • US9117632B2 patent drawing
  • US9117632B2 patent drawing
  • US9117632B2 patent drawing

AI summary

A charged particle beam writing apparatus includes a map generation unit to generate a map where a parameter concerning a chip is defined for each mesh region obtained by virtually dividing a region including the chip including a plurality of figure patterns into a plurality of mesh regions, an exchange unit to, when performing at least one data processing of reversal and rotation for data of the chip, centering on the center of the chip or the center of the region including the chip, exchange parameters each being the parameter defined for each mesh region in the map, to be corresponding to the position of a figure pattern for which the data processing was performed, and a writing unit to write the figure pattern in the chip for which at least one data processing of reversal and rotation was performed on a target object with a charged particle beam.