Bent Tip Probe Force Detection for Joint Examination

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Solution Overview

Problem

Current joint examination and diagnosis methods using probes rely heavily on the physician's skill and experience, making it difficult for inexperienced practitioners to accurately evaluate joint conditions and quantify damage post-surgical procedures.

Innovation Solution

A diagnostic device featuring a probe with a bent tip and a force detector that measures forces applied in multiple directions, allowing for quantitative evaluation of joint conditions without relying on user skill, and includes a support member for reproducible movement adjustments.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a probe is used for joint examination relying on physician's sense and experience, then the examination can be performed with simple equipment, but the measurement precision and reliability are insufficient for inexperienced physicians

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical sensing system (physician's hand and sense) with an electronic detection system. The detector (2) electronically measures forces applied to the probe tip in multiple directions, converting mechanical interactions into electrical signals for precise quantitative analysis, thereby eliminating dependence on physician experience while maintaining operational simplicity.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces a detector as an intermediary between the probe and the physician's interpretation. The detector objectively measures forces in the first direction (pull/push) and second direction (perpendicular forces), serving as a mediator that translates physical interactions into reliable data, thus improving measurement precision without complicating the overall examination process.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Adaptability or versatility

If a probe extends only in one direction, then the device structure is simple, but the adaptability for diverse joint examinations is limited

Engineering Contradiction:
ImproveadaptabilityVSAvoiddevice complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies curvature by providing a bent tip portion (1b) at the end of the probe. This bent configuration enables the probe to adapt to various joint geometries and examination angles while maintaining a relatively simple linear probe body structure, thus improving versatility without significantly increasing device complexity.

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

The patent adds a second detection dimension by measuring forces not only in the first direction (along the probe axis) but also in a second direction intersecting with it. This dimensional expansion of measurement capability allows diverse joint examinations without requiring multiple separate probes, achieving adaptability while keeping the device structure relatively simple.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient and accurate evaluation of joint conditions by quantitatively assessing forces applied during examination, reducing dependence on user skill and ensuring reproducibility of measurements.

Implementation Method 1

a detector that detects a force applied to the tip portion of the probe in the first direction, and detects a force applied to the tip portion of the probe in a second direction intersecting with the first direction

Methodology Applied
Scientific EffectForce detection: Force

Data Source

PatentUS11147504B2Examination diagnosis device
Publication Date: 2021.10.19 JAPAN HEALTHCARE ENGINEER ASSOCIATION LLC
  • US11147504B2 patent drawing
  • US11147504B2 patent drawing
  • US11147504B2 patent drawing

AI summary

An examination diagnosis device includes a probe, a stress detector and a grip. The probe has an elongated portion and a tip portion, and the tip portion is provided to be bent at one end of the elongated portion. The stress detector is configured to be able to detect a force in an X direction, a force in a Y direction and a force in a Z direction applied to the tip portion of the probe. The tip portion of the probe may be bent in a plane parallel to the X direction and the Z direction. A user allows the tip portion of the probe to come into contact with a joint portion that is a subject of examination and diagnosis while gripping the grip.