β-(AlxGa1-x)2O3 Composition for Thick Power Device Epitaxy

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Solution Overview

Problem

Current semiconductor materials used in power devices are reaching their performance limits, necessitating compositions and devices with improved properties, particularly in terms of thick film growth, controllable doping, and smooth surface morphology to enhance device performance.

Innovation Solution

The development of β-(AlxGa1-x)2O3 compositions with low Al content (x < 5%) and n-carrier dopants, grown using methods like MOCVD at controlled temperatures and pressures, achieving fast growth rates and smooth surfaces, enabling high-quality thick films with tunable doping for vertical power devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional semiconductor materials are used in power devices, then current device performance is maintained, but performance improvement is limited as materials reach their limits

Engineering Contradiction:
Improvedevice performanceVSAvoidperformance improvement potential
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent changes the material composition parameters by using β-(AlxGa1-x)2O3 with controlled Al content (x < 5%) and adjustable n-carrier dopant concentrations (1×10^14 to 5×10^17 cm^-3), enabling improved critical field strength and electron mobility beyond conventional materials

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs composite material strategy by creating Al-Ga-O ternary compounds that combine the advantages of Ga2O3 (high breakdown field) with Al2O3 (structural stability), achieving superior electrical properties while maintaining mechanical integrity

Inventive Principle:
Principle #40Composite materials

2Length of stationary object

If thick films are grown to enhance device performance, then device functionality is improved, but surface morphology deteriorates with roughness and defects

Engineering Contradiction:
Improvefilm thicknessVSAvoidsurface smoothness
Core Design Contradiction:
Length of stationary objectVSManufacturing precision

Solution Approach 1:

The patent optimizes growth parameters including temperature (650-1000°C), pressure (1-760 Torr), and precursor flow rates to achieve fast growth rates (>3 μm/h) while maintaining smooth surfaces, demonstrating that parameter optimization can decouple thickness from surface quality

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent uses low Al content (x < 5%) as an intermediary composition that suppresses surface roughening defects during thick film growth, acting as a mediator between the substrate and the growing film to maintain surface quality throughout the thickness buildup

Inventive Principle:
Principle #24Intermediary (Mediator)

3Productivity

If fast growth rates are achieved to improve productivity, then manufacturing efficiency is enhanced, but film quality may deteriorate with defects and roughness

Engineering Contradiction:
Improvefilm growth rateVSAvoidfilm quality
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent identifies optimal parameter windows (temperature 650-1000°C, pressure 1-760 Torr, low Al content x < 5%) that enable fast growth rates exceeding 3 μm/h while maintaining high film quality with smooth surfaces and controlled doping, proving that quality and productivity can be simultaneously achieved through parameter optimization

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method produces β-(AlxGa1-x)2O3 films with enhanced critical field strength and electron mobility, facilitating the fabrication of high-performance vertical Schottky barrier diodes and PN heterojunction power diodes with increased breakdown voltage and power figure-of-merit.

Implementation Method 1

comprising at least one n-carrier dopant in a concentration of about 1×10^14 cm−3 to about 5×10^17 cm−3

Methodology Applied
Scientific Effectn-carrier doping: Dopants

Implementation Method 2

the method of forming the Al-Ga-containing film comprises metal-organic chemical vapor deposition (MOCVD)

Methodology Applied
Scientific EffectMetal-organic chemical vapor deposition: Chemical Vapour Deposition

Implementation Method 3

the method of forming the Al-Ga-containing film comprises metal-organic chemical vapor deposition (MOCVD), molecular-beam epitaxy (MBE)

Methodology Applied
Scientific EffectMolecular-beam epitaxy: Epitaxy

Data Source

PatentUS20260055503A1Compositions, methods, and devices
Publication Date: 2026.02.26 OHIO STATE INNOVATION FOUND
  • US20260055503A1 patent drawing
  • US20260055503A1 patent drawing
  • US20260055503A1 patent drawing

AI summary

Disclosed herein are compositions, methods, and devices. Disclosed herein is a composition comprising a β-(AlxGa1-x)2O3, having an x value of less than about 5% and comprising at least one n-carrier dopant. Also disclosed are methods of making the same. Also disclosed are devices comprising the disclosed compositions.