Bias Circuit Compensation for Semiconductor PVT Variations

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Solution Overview

Problem

Semiconductor devices experience performance degradation due to changes in characteristics caused by external factors such as process, voltage, and temperature variations, which affect circuit operations.

Innovation Solution

A semiconductor device incorporating a bias circuit that generates a reference current or voltage based on the device's characteristics, using a process monitoring circuit to detect and compensate for manufacturing deviations and temperature changes through a variable resistor adjusted by a control code signal, ensuring insensitivity to process variables.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a bias circuit generates reference current or voltage based on fixed design parameters, then the circuit structure is simple, but the performance degrades due to process, voltage, and temperature variations

Engineering Contradiction:
Improvecircuit structureVSAvoidperformance stability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The bias circuit dynamically adjusts the reference current or voltage based on real-time detection of device characteristics. The control code signal generated by the process monitoring circuit enables the bias circuit to adapt its output parameters, transforming a static circuit into a dynamic one that compensates for PVT variations and maintains stable performance.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The process monitoring circuit detects device characteristics and generates a control code signal that feeds back to the bias circuit. This feedback mechanism enables the bias circuit to automatically adjust its reference current or voltage output based on the detected process deviations, thereby compensating for manufacturing variations and maintaining reliable performance.

Inventive Principle:
Principle #23Feedback

2Reliability

If a process monitoring circuit is added to detect and compensate for manufacturing deviations, then performance stability improves, but device complexity increases

Engineering Contradiction:
Improveperformance stabilityVSAvoidcircuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The process monitoring circuit automatically detects device characteristics and generates control code signals without external intervention. The system performs self-diagnosis and self-adjustment by using the control code signal to compensate for its own manufacturing deviations, eliminating the need for external calibration equipment or manual adjustment.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The bias circuit changes its reference current or voltage parameters based on the control code signal from the process monitoring circuit. By adjusting these electrical parameters dynamically, the system compensates for manufacturing variations in device characteristics, thereby improving performance stability without requiring structural modifications to the core functional circuits.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20250293693A1Semiconductor device and semiconductor system including the same
Publication Date: 2025.09.18 SAMSUNG ELECTRONICS CO LTD
  • US20250293693A1 patent drawing
  • US20250293693A1 patent drawing
  • US20250293693A1 patent drawing

AI summary

A semiconductor device may include: an amplifier circuit biased by a reference current or a reference voltage and configured to amplify an input signal; a process monitoring circuit configured to output a control code signal to compensate a manufacturing process deviation of the semiconductor device; and a bias circuit configured to receive the control code signal and to change the reference current or the reference voltage based on the control code signal.