Bias Generator Testing via Grouped Current Subsets
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Solution Overview
Problem
In electronic systems, particularly those requiring real-time monitoring like automotive or aeronautic systems, bias generators generate numerous bias currents, making it challenging to test them efficiently within a short time frame without impacting system operation, as conventional sequential testing is time-consuming and can disrupt radar detection operations.
Innovation Solution
A method that groups bias currents into subsets, allowing for sequential testing of each subset as a single test current through a variable resistor, converting the resulting voltage to a digital value for comparison against predetermined values to determine test status, thereby reducing testing time and enhancing real-time safety operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If sequential testing of each bias current is performed, then testing completeness is improved, but testing time increases
Solution Approach 1:
The patent divides the set of bias currents into multiple subsets and tests each subset separately. This segmentation allows the testing process to handle multiple currents in an organized manner while reducing the time penalty of sequential testing by enabling parallel subset execution and optimized test procedures for each subset.
Solution Approach 2:
The patent combines multiple bias currents into subsets and tests them collectively rather than individually. By merging currents into groups and using combined test signals, the system achieves comprehensive testing coverage while reducing the total number of separate test operations required, thereby decreasing overall testing time.
2Reliability
If frequent real-time monitoring is implemented, then safety compliance is improved, but system operational time decreases
Solution Approach 1:
The patent implements periodic testing of bias currents by dividing them into subsets and sequentially testing each subset. This periodic approach enables frequent safety monitoring to be performed in structured intervals, ensuring compliance with safety standards while minimizing the impact on continuous system operation through efficient test scheduling.
Solution Approach 2:
The patent performs preliminary grouping of bias currents into subsets before the actual testing process. This preliminary organization enables the system to quickly execute tests during operational cycles, ensuring safety compliance is maintained without significantly reducing the time available for radar detection and other primary functions.
3Measurement precision
If multiple bias currents are tested individually, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent employs a universal testing approach where a single test signal and measurement system are used to test multiple bias currents within each subset. This multi-functional testing methodology maintains measurement precision for individual currents while avoiding the need for separate dedicated test equipment for each current, thereby reducing overall device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables faster and more efficient bias current generation testing, reducing the time required for safety checks and allowing for more frequent radar detection operations by grouping bias currents, thus improving system efficiency and compliance with safety standards.
Implementation Method 1
configuring a variable resistor to have a corresponding resistance based on the number of bias currents represented in the subset; providing a corresponding test current to the variable resistor configured to the corresponding resistance; determining a test status for the subset of bias currents based on a voltage across the variable resistor resulting from conducting the corresponding test current
Data Source
AI summary
An electronic device includes a bias generator to generate a plurality of bias currents and a testing module to test the bias generator by successively testing each subset of bias currents of a plurality of subsets of bias currents grouped from the plurality of bias currents as a corresponding single test current. The testing module can include a variable resistor, wherein the testing module is to test the bias generator by, for each subset of bias currents, configuring the variable resistor to have a corresponding resistance based on the number of bias currents represented in the subset, conducting a corresponding test current through the variable resistor configured to the corresponding resistance, the test current representing a combination of all bias currents of the corresponding subset, and determining a test status for the subset of bias currents based on a voltage across the variable resistor resulting from the corresponding test current.