Bidirectional Optical Signal Propagation Simulation for Photonic Integrated Circuits
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Solution Overview
Problem
Conventional simulation tools for photonic integrated circuit (PIC) design have limited functionality in accurately modeling optical signal propagation, failing to account for both electric and optical signals effectively.
Innovation Solution
A system and method incorporating an optical signal propagation simulation program with virtual optical probing functions and bidirectional optical signal propagation simulation capabilities, allowing for the calculation and output of optical signal parameter values through a graphic user interface, enabling more accurate modeling of PIC performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional simulation tools are used for PIC design, then the design process is simpler, but the accuracy of optical signal propagation modeling is insufficient
Solution Approach 1:
The patent combines electrical signal simulation and optical signal propagation simulation into a single unified simulation tool. The system integrates SPICE-based electrical simulation capabilities with optical propagation modeling, allowing both types of signals to be simulated within one tool rather than requiring separate tools, thus improving accuracy without proportionally increasing complexity
Solution Approach 2:
The patent introduces virtual optical probing as an intermediary mechanism that allows optical signal parameters to be extracted and analyzed within the electrical simulation framework. This intermediary approach enables optical signal propagation modeling without requiring a complete overhaul of the existing simulation architecture
2Reliability
If electrical simulations only are performed using extracted netlists, then the simulation process is faster, but the PIC performance modeling is incomplete
Solution Approach 1:
The patent performs preliminary electrical simulations using extracted netlists to establish baseline performance, then overlays optical propagation analysis on the same simulation data. This preliminary action approach allows the system to get quick electrical results first, then add optical modeling without requiring completely separate simulation runs
Solution Approach 2:
The simulation tool is designed to perform multiple functions including electrical signal simulation, optical propagation modeling, and hybrid electro-optical analysis within a single unified platform. This multi-functionality allows the same tool to handle both simple electrical simulations and comprehensive electro-optical analyses
3Measurement precision
If unidirectional optical signal propagation is simulated, then the simulation complexity is reduced, but the accuracy of bidirectional device analysis is compromised
Solution Approach 1:
The patent segments the optical propagation analysis into separate forward and reverse direction simulations. Each direction can be independently configured and analyzed, allowing the system to handle bidirectional devices by running separate unidirectional simulations and combining the results, thus managing complexity while maintaining accuracy
Data Source
AI summary
Systems and methods for designing photonic integrated circuits (PICs) include a simulation program with virtual optical probing functions and, optionally, bidirectional optical signal propagation simulation. For probing, a processor receives an output expression specifying a virtual optical probing function (e.g., for power in dBm, etc.) and a net within a PIC design. If different simulation types are enabled, the expression specifies simulation type. If bidirectionality is enabled, the expression specifies the forward or reverse direction. In response, the processor accesses the PIC design and results of simulation(s) thereof and calculates and outputs an optical signal parameter value for the specified net. For bidirectionality, component descriptions of photonic device cells define, at each input/output terminal, pins associated with each of multiple optical signal components in both directions and, when such cells are incorporated into a PIC design, analytical functions employ the pins to model the optical signal components in both directions.