Bifurcated Optical Fiber Probe for Dual Spectroscopy

Solution Overview

Problem

Conventional methods for characterizing material samples using absorption/reflectance spectroscopy and fluorescence spectroscopy require separate instruments and large optical tables, making them costly, time-consuming, and space-intensive.

Innovation Solution

A device and method utilizing a bifurcated optical fiber probe connected to a spectrometer, allowing for simultaneous reflectance absorbance and photoluminescence measurements using a single probe, integrated with a substrate and light emitting devices, enabling in-situ and ex-situ characterization with reduced space, time, and cost.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If separate dedicated benchtop instruments are used for absorption/reflectance spectroscopy and fluorescence spectroscopy, then measurement precision is maintained, but device complexity and space requirements increase

Engineering Contradiction:
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent combines absorption/reflectance spectroscopy and fluorescence spectroscopy capabilities into a single integrated optical probe system. The probe integrates multiple optical fibers (illumination fibers, collection fibers) and light sources (laser diode, LED) into one unified device that can perform both types of spectroscopy measurements, thereby reducing device complexity and space requirements while maintaining measurement precision

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The optical probe is designed with multi-functionality to perform both absorption/reflectance spectroscopy and fluorescence spectroscopy using a single device. The probe can switch between different measurement modes by activating different light sources and collection paths, making it a universal instrument that replaces multiple dedicated instruments

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If separate dedicated benchtop instruments are used for absorption/reflectance spectroscopy and fluorescence spectroscopy, then measurement accuracy is ensured, but time consumption and cost increase

Engineering Contradiction:
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

By merging both spectroscopy capabilities into one probe, the system eliminates the need to physically move samples between different instruments and perform sequential measurements. Both absorption/reflectance and fluorescence measurements can be performed in-situ at the same location, significantly reducing characterization time while maintaining accuracy

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The probe is pre-configured with all necessary optical components (illumination fibers, collection fibers, light sources) integrated into a single unit that can perform multiple measurement types. This preliminary integration eliminates setup and reconfiguration time between different measurement modes

Inventive Principle:
Principle #10Preliminary action

3Reliability

If separate dedicated benchtop instruments are used for absorption/reflectance spectroscopy and fluorescence spectroscopy, then measurement reliability is maintained, but space requirements and cost increase

Engineering Contradiction:
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent merges multiple spectroscopy functions into a compact handheld probe that can be positioned near the sample without requiring large optical tables. The integrated design with bundled optical fibers and compact light sources dramatically reduces the space footprint while maintaining measurement reliability through proper optical coupling and signal collection

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The probe transitions from traditional benchtop optical table configurations to a compact, portable form factor. By reconfiguring the optical paths and using fiber optic technology, the system moves from a two-dimensional optical table layout to a three-dimensional compact probe structure that can be positioned close to the sample, reducing overall space requirements

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient and cost-effective dual characterization of material samples by integrating reflectance absorbance and photoluminescence measurements into a single probe, reducing the need for multiple instruments and large optical setups.

Implementation Method 1

a reflectance absorbance measurement of the sample associated with the first light emitting device

Methodology Applied
Scientific EffectReflectance absorbance: Absorption (EM radiation)

Implementation Method 2

a photoluminescence measurement of the sample associated with the second light emitting device

Methodology Applied
Scientific EffectPhotoluminescence: Photoluminescence

Data Source

PatentUS20240246075A1Dual UV-vis reflectance absorbance and photoluminescence modules
Publication Date: 2024.07.25
  • US20240246075A1 patent drawing
  • US20240246075A1 patent drawing
  • US20240246075A1 patent drawing

AI summary

Devices, systems, and methods for characterizing material samples. In one aspect, a device for characterizing a sample includes a substrate configured for receiving a sample thereon; an optical fiber probe comprising a first end positioned near the sample and a second end that is bifurcated to include one or more first fiber configured for connection to a first light emitting device and one or more second fiber configured for connection to a spectrometer; a reflectance module coupled to the substrate; and a second light emitting device positioned near the sample. The optical fiber probe is configured for selectively obtaining at the spectrometer both a reflectance absorbance measurement of the sample associated with the first light emitting device and a photoluminescence measurement of the sample associated with the second light emitting device.