Binary Grating Reflection Suppression via High-Frequency Pattern Interference
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Solution Overview
Problem
Existing binary grating projection methods for three-dimensional shape measurement face challenges in suppressing reflective areas, which reduce measurement accuracy due to the need for reducing grating intensity or complex algorithms, and existing image restoration methods introduce errors and distortions.
Innovation Solution
The method employs high-frequency pattern interference to generate interfering binary gratings, which are projected and synthesized to separate reflective and direct light components, effectively suppressing reflections and improving measurement accuracy without reducing grating intensity or using complex algorithms.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Object-affected harmful factors
If the intensity of grating projection is reduced to avoid reflective areas, then the occurrence of reflective phenomena is reduced, but the quality of grating field collected by the camera deteriorates and background light interference increases
Solution Approach 1:
The patent segments the light field into multiple high-frequency patterns (e.g., 4 patterns with different frequencies and orientations). By projecting these segmented patterns separately and synthesizing their results, the system can identify and eliminate reflective components while preserving valid measurement data, thus resolving the contradiction between reducing reflections and maintaining measurement accuracy
Solution Approach 2:
The patent introduces high-frequency patterns as an intermediary medium. These patterns act as a mediator between the projection system and the measured object, enabling the separation of reflective components from valid grating information through frequency analysis and synthesis, thereby avoiding the need to reduce overall grating intensity
2Measurement precision
If image restoration is used to overcome the influence of reflective areas, then the missing grating information can be restored, but the grating field distribution may be destroyed and additional measurement errors introduced
Solution Approach 1:
Instead of trying to restore missing information in reflective areas (forward approach), the patent inverts the problem by using high-frequency patterns that are deliberately designed to be different from the measurement grating. The synthesis process then subtracts out the reflective components, effectively recovering valid information without the errors introduced by conventional restoration methods
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the accuracy of three-dimensional appearance measurements by eliminating reflective areas and improving the robustness of binary threshold segmentation, while avoiding additional errors and maintaining high grating field quality.
Implementation Method 1
employing a method for suppressing reflection in binary grating image projection based on high-frequency pattern interference
Data Source
AI summary
The present invention discloses a method for suppressing reflection of binary grating image projection based on high-frequency pattern interference including generating multiple high-frequency patterns for reflection suppression; generating a binary grating for three-dimensional appearance measurement, wherein the binary grating is inverted to generate a reverse binary grating; generating multiple interfering binary gratings. The projection images of multiple interfering binary gratings projected by the projector and then collected by the camera are used as output images, and all output images are synthesized in a certain manner to obtain an output image after reflection suppression, which is used as a result of the binary grating image to be projected after reflection suppression. The invention effectively eliminates the wrong measurement result caused by reflection in the three-dimensional measurement of the binary grating projection method, and improves the accuracy of the three-dimensional appearance measurement based on the binary grating projection method.