Biochip Vision System Top-Down Illumination Defect Detection
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Solution Overview
Problem
Current vision systems for quality control of biochips with coatings are less effective due to light being blocked by the coating, making it difficult to image defects outside the discrete reaction zones, and require higher quality imagers, which increases complexity and cost.
Innovation Solution
A vision system that directs illumination onto the face of the biochip sheet, allowing light to be reflected and imaged, enabling the detection of defects outside the reaction zones without the need for a high-quality imager, by using a lower quality imager with a reduced field of view and moveable components for precise imaging.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If backlighting is used to image biochips with coatings, then the imaging process is simple and cost-effective, but defects outside discrete reaction zones cannot be detected
Solution Approach 1:
The patent inverts the conventional backlighting approach by using top-down illumination instead. The illumination source is positioned above the biochip sheet and directs light onto the face containing the discrete reaction zones, allowing reflected light to carry defect information to the imager. This inversion enables detection of defects outside reaction zones while maintaining system simplicity.
Solution Approach 2:
The patent introduces a reflective intermediary mechanism where illumination light reflects off the biochip surface (including coating surfaces) to carry defect information. The reflected light acts as an intermediary that enables the imager to detect defects without direct line-of-sight penetration through the coating, solving the detection problem while using standard imaging components.
2Measurement precision
If higher quality imagers are used to detect defects on coated biochips, then defect detection capability is improved, but system complexity and cost increase
Solution Approach 1:
By inverting the illumination approach from backlighting to top-down illumination, the patent enables standard imagers to detect defects on coated biochips that would otherwise require specialized high-quality imagers. The reflected light path preserves defect information without requiring the imager to penetrate or see through the coating.
Solution Approach 2:
The patent replaces the need for complex, high-quality imagers with a simpler optical arrangement. Instead of relying on advanced imager capabilities to see through coatings, the system uses a substituted optical path where reflected light carries the necessary defect information to standard imaging components.
3Productivity
If backlighting is used to image the whole biochip sheet, then processing speed is high, but defects outside reaction zones remain undetected
Solution Approach 1:
The patent maintains high processing speed by imaging the entire biochip sheet in parallel while inverting the illumination approach. Top-down illumination with reflected light detection enables simultaneous capture of all biochips on the sheet, including defects outside reaction zones, preserving productivity while expanding detection coverage.
4Measurement precision
If top-down illumination is used to image coated biochips, then defect detection capability is improved, but illumination uniformity becomes more difficult to achieve
Solution Approach 1:
The patent uses the biochip surface itself as an intermediary reflector. The illumination source directs light onto the biochip face, and the surface (including coating) reflects the light back to the imager. This intermediary reflection naturally handles illumination uniformity challenges by using the sample surface as the reflection interface.
Solution Approach 2:
The patent leverages the contrast between the dark coating and the lighter discrete reaction zones. The coating reflects less light, creating a natural contrast that enhances defect detectability. This color/reflectivity difference serves as a built-in contrast mechanism that improves defect detection while managing illumination challenges.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for effective quality control of both coated and non-coated biochips with improved spatial resolution and reduced processing power, maintaining quality without the need for expensive imaging equipment.
Implementation Method 1
an illumination source arranged in use to direct illumination on to the face of said biochip sheet, thereby illuminating defects on the at least one biochip
Data Source
AI summary
There is provided a vision system for assessing defects on biochips and a corresponding method. The vision system comprises an imaging region in which a biochip sheet including at least one biochip is locatable in use: an imager arranged in use to image at least a portion of the imaging region, wherein, when the biochip sheet is located in the imaging region. the portion includes at least a face of the biochip sheet: and an illumination source arranged in use to direct illumination on to the face the biochip sheet. thereby illuminating defects on the at least one biochip when a mask material layer is present on the at least one biochip and when a mask material is absent and allowing the defects to be included in the imaged at least a portion of the imaging region.