Biometric Debug Tool for Circuit Design Waveform Analysis

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Solution Overview

Problem

The existing debugging processes for microdevice circuit designs are tedious and inefficient, requiring designers to manually review thousands of clock cycles of waveform data to identify bugs, which can be time-consuming and labor-intensive, especially when dealing with complex designs that involve billions of states or transitions.

Innovation Solution

A debug tool that utilizes biometric markers to simulate circuit designs, perform functional verification, and initiate a debug process by prompting the display of simulated outputs in a debug window, accentuating specific values or occurrences relative to other values based on the specified markers, thereby facilitating the identification of bugs in the circuit design.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual review of waveform data is used to debug circuit designs, then designers can identify bugs in the circuit design, but the process becomes time-consuming and labor-intensive

Engineering Contradiction:
Improvebug detection accuracyVSAvoiddebugging time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces the mechanical manual review process with an automated computer-based system that uses signal processing and pattern recognition algorithms to analyze waveform data, thereby eliminating the time-consuming manual inspection while maintaining bug detection capability

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces an intermediary debugging system that acts as a bridge between the raw waveform data and the designer, automatically processing and highlighting relevant information so that designers can focus on critical issues rather than reviewing all data manually

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If manual review of waveform data is used to debug circuit designs, then designers can identify bugs in the circuit design, but the process becomes labor-intensive

Engineering Contradiction:
Improvebug detection accuracyVSAvoiddebugging effort
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent replaces the manual mechanical review process with an automated computer-based system that performs bug detection, thereby reducing the labor-intensive nature of the task while preserving detection accuracy

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The debugging system performs self-service by automatically analyzing waveform data, generating reports, and identifying potential bugs without requiring extensive manual intervention from designers, thus reducing overall debugging effort

Inventive Principle:
Principle #25Self-service

3Measurement precision

If conventional debugging methods are used for complex designs, then all states and transitions can be reviewed, but the process becomes excessively time-consuming

Engineering Contradiction:
Improvecomprehensive bug detectionVSAvoiddebugging efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent extracts and prioritizes only the most relevant waveform data and potential bug indicators from the vast amount of simulation data, allowing the system to maintain comprehensive detection capability while focusing computational resources on high-probability issues

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent uses automated signal processing and pattern recognition to replace manual review, enabling the system to efficiently analyze complex designs with billions of states and transitions without the excessive time consumption associated with conventional methods

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentUS8893065B2Biometric markers in a debugging environment
Publication Date: 2014.11.18 SIEMENS INDUSTRY SOFTWARE INC
  • US8893065B2 patent drawing
  • US8893065B2 patent drawing
  • US8893065B2 patent drawing

AI summary

This application discloses a debug tool to prompting display of at least a portion of a simulated output for a circuit design in a debug window, identifying a marker corresponding to a value in the simulated output has been specified for the debug environment, and prompting accentuation of one or more occurrences of the value in the debug window relative to other values in the simulated output based, at least in part, on the marker specified for the debug environment.