Bipolar Electrostatic Chuck Electrode Layout for Wafer Temperature Uniformity

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Solution Overview

Problem

Conventional substrate support systems in semiconductor manufacturing face challenges with temperature non-uniformity, leading to film thickness issues due to uneven current flow and resistive heating, which can cause hotspots and plasma-related problems like arcing and substrate discoloration.

Innovation Solution

The substrate support assemblies incorporate a configuration of bipolar electrodes with a spoked connector and RF-powered electrodes, ensuring uniform current distribution and reducing resistive heating, while maintaining bipolar chucking capabilities and supporting RF modulation to enhance temperature uniformity and plasma deposition across the wafer.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If conventional substrate support systems are used, then substrate processing can be performed, but temperature non-uniformity occurs leading to film thickness issues

Engineering Contradiction:
Improvetemperature uniformityVSAvoidfilm thickness uniformity
Core Design Contradiction:
TemperatureVSManufacturing precision

Solution Approach 1:

The substrate support system divides the electrode structure into multiple bipolar electrodes arranged in a segmented pattern across the substrate surface. This segmentation allows independent control of different regions, enabling compensation for temperature variations and achieving more uniform heating across the entire substrate, thereby improving both temperature uniformity and film thickness consistency

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The bipolar electrode configuration provides different electrical properties at different locations on the substrate support. By varying the electrode arrangement and connectivity patterns in different regions, the system can deliver localized heating control to address specific temperature non-uniformity issues in different areas of the substrate

Inventive Principle:
Principle #3Local quality

2Productivity

If higher temperatures are used to increase deposition rates, then productivity improves, but temperature non-uniformity worsens causing film thickness issues

Engineering Contradiction:
Improvedeposition rateVSAvoidtemperature non-uniformity
Core Design Contradiction:
ProductivityVSTemperature

Solution Approach 1:

The bipolar electrode system enables dynamic control of heating patterns by adjusting the electrical connectivity and polarity of different electrode segments in real-time. This dynamic capability allows the system to optimize temperature distribution during high-rate deposition processes, maintaining uniformity even at elevated temperatures that increase productivity

Inventive Principle:
Principle #15Dynamics

3Device complexity

If conventional electrode configurations are used, then device complexity is low, but hotspots and plasma-related problems occur

Engineering Contradiction:
Improveelectrode configuration complexityVSAvoidhotspots and arcing
Core Design Contradiction:
Device complexityVSObject-generated harmful factors

Solution Approach 1:

The bipolar electrode arrangement creates equipotential regions across the substrate support surface by strategically configuring the electrode connections. This equipotential design distributes electrical field intensity more uniformly, preventing concentration of current that would otherwise create hotspots and reduce plasma-related issues such as arcing

Inventive Principle:
Principle #12Equipotentiality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration improves temperature uniformity across the substrate, reduces hotspots, and minimizes plasma-related issues such as arcing and substrate discoloration, resulting in more consistent film deposition and improved semiconductor processing outcomes.

Implementation Method 1

maintaining bipolar chucking capabilities

Methodology Applied
Scientific EffectElectrostatic force: Electrostatics

Implementation Method 2

supporting RF modulation to enhance temperature uniformity and plasma deposition across the wafer

Methodology Applied
Scientific EffectRadio frequency electromagnetic field: Electromagnetic Induction

Data Source

PatentUS20240249924A1Bipolar electrostatic chuck electrode designs
Publication Date: 2024.07.25 APPLIED MATERIALS INC
  • US20240249924A1 patent drawing
  • US20240249924A1 patent drawing
  • US20240249924A1 patent drawing

AI summary

Exemplary substrate support assemblies may include an electrostatic chuck body defining a substrate support surface that defines a substrate seat. The assemblies may include a support stem coupled with the electrostatic chuck body. The assemblies may include a first bipolar electrode embedded within the electrostatic chuck body. The assemblies may include a second bipolar electrode embedded within the electrostatic chuck body. An entirety of the second bipolar electrode may be radially inward of at least a portion of the first bipolar electrode. The first bipolar electrode and the second bipolar electrode may be coaxial with one another. Each of the first bipolar electrode and the second bipolar electrode may be coupled with at least one RF power supply. Each of the first bipolar electrode and the second bipolar electrode may be coupled with at least one DC power supply.