BIST Centric ATE Framework Using UART Links
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Solution Overview
Problem
Conventional Automated Test Equipment (ATE) frameworks are costly and complex, as they perform exhaustive testing that not all customers require, necessitating a simpler and less expensive solution for volume testing of Devices Under Test (DUTs).
Innovation Solution
The implementation of a low-cost Built-in-Self-Test (BIST) centric ATE framework using Universal Asynchronous Receiver-Transmitters (UARTs) to initiate and control BIST on DUTs via serial communication links, allowing DUTs to generate and send test data internally, reducing the required functionality and complexity of the ATE framework.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional Automated Test Equipment (ATE) frameworks are used to perform exhaustive testing, then testing completeness and reliability are improved, but system complexity and cost increase
Solution Approach 1:
The patent implements Built-in-Self-Test (BIST) circuits within the DUT that automatically generate test patterns and perform testing without external test equipment. The DUT tests itself using internal resources, eliminating the need for complex external ATE systems while maintaining testing reliability through self-diagnostic capabilities
Solution Approach 2:
The patent extracts the testing function from the external ATE system and relocates it into the DUT itself through BIST circuits. This separation removes the need for expensive external testing equipment by embedding the testing capability directly within the device being tested
2Reliability
If conventional Automated Test Equipment (ATE) frameworks are used to perform exhaustive testing, then testing completeness are improved, but cost increases
Solution Approach 1:
The DUT performs self-testing through integrated BIST circuits that generate test patterns and evaluate functionality internally. This eliminates the need for expensive external ATE systems, significantly reducing testing costs while maintaining comprehensive test coverage through self-diagnostic capabilities
Solution Approach 2:
The patent uses simple, low-cost UART communication interfaces instead of expensive proprietary test protocols. The BIST implementation uses basic digital logic circuits rather than complex test equipment, providing cost-effective testing that is sufficient for volume production environments
3Device complexity
If Built-in-Self-Test (BIST) circuits are used for volume testing, then system complexity and cost are reduced, but testing capability must be self-contained in DUTs
Solution Approach 1:
The patent implements a universal BIST framework that can test multiple types of DUTs (SSDs, memory devices, processors) using the same basic architecture. The UART-based communication interface provides a standardized method for initiating and collecting test results across different device types, enhancing versatility without increasing complexity
Solution Approach 2:
The BIST system is designed to be dynamically configurable through UART commands, allowing test parameters, patterns, and evaluation criteria to be adjusted based on the specific DUT being tested. This dynamic adaptability enables the same hardware framework to accommodate various testing scenarios and device types
Data Source
AI summary
A Built-in-Self-Test (BIST) centric Automatic Test Equipment (ATE) framework can include a host controller and one or more tester units. The host controller can be configured to receive one or more inputs to initiate testing of a plurality of Devices Under Test (DUTs). The one or more tester unit can include a plurality of Universal Asynchronous Receiver-Transmitters (UARTs) communication links. The UART communication links can be configured to send one or more commands for initiating and controlling a Built-in-Self-Test (BIST) in the plurality of DUTs. The UART communication links can also be configured to receive test output data of the BIST from the plurality of DUTs. The host controller can also be configured to output the test output data of the BIST.