Self-Contained BIST Circuit Phase Rotator for High-Speed Receiver Testing
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Solution Overview
Problem
In high-speed receiver integrated circuits, existing self-test systems require a connection to a transmitter for test sequence generation, limiting independent testing of receivers and increasing overall test time.
Innovation Solution
A self-contained built-in self-test (BIST) path with a phase rotator within the receiver generates a binary test sequence by shifting the phase of an on-chip clock signal, allowing the receiver to perform self-testing without relying on a transmitter, thereby reducing test time and enhancing testing coverage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a connection to a transmitter is used for test sequence generation, then the test sequence can be generated externally, but the receiver cannot be tested independently and overall test time increases
Solution Approach 1:
The receiver is equipped with a built-in self-test circuit that includes a phase rotator and binary sequence generator, enabling it to generate test sequences autonomously without requiring an external transmitter connection. This self-service capability allows the receiver to perform complete self-testing, eliminating the time-consuming setup of external transmitter connections and enabling independent testing.
Solution Approach 2:
The self-test functionality is segmented into distinct modular components including a phase rotator for phase shifting and a binary sequence generator for test pattern generation. This segmentation allows each component to be independently optimized and integrated within the receiver, providing independent testing capability while maintaining efficient operation.
2Productivity
If a built-in self-test circuit with phase-shifting is implemented, then independent testing is enabled, but the device complexity increases
Solution Approach 1:
The built-in self-test circuit is designed with multi-functionality, where the phase rotator and binary sequence generator can serve both self-testing purposes and potentially support other receiver functions. This universal design approach allows the additional components to contribute to multiple objectives, thereby justifying the increased device complexity through enhanced productivity and versatile functionality.
Data Source
AI summary
Aspects of the invention include a phase rotator, that is located at a built-in self-test (BIST) path of a receiver, receiving a clock signal from an on-chip clock. The phase rotator shifts the phases of the clock signal. The phase rotator transmits the shifted clock signal to a binary sequence generator, that is located at the receiver. The binary sequence generator outputs a binary sequence, where the binary sequence generator is driven by the shifted clock signal.