BIST Signature Adjustment Code for ROM Self-Verification
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Solution Overview
Problem
In integrated circuits with Built-In Self-Test (BIST) circuits, changing the code or data stored in ROM requires updating the predetermined signature pattern, leading to additional mask costs and testing expenses, especially for electronic products that need to execute BIST every time they turn on.
Innovation Solution
An integrated circuit design that includes a BIST circuit, a ROM storing information and a BIST signature adjustment code irrelevant to functional data, allowing the generation of a signature pattern identical to previous versions by using a BIST signature adjustment code to match the signature pattern of the previous chip, thus avoiding changes to the predetermined signature pattern and reducing mask redesign and testing costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the code or data stored in ROM is changed, then the functionality of the electronic product is improved or updated, but the predetermined signature pattern must be updated, leading to additional mask costs and testing expenses
Solution Approach 1:
The patent introduces a BIST signature adjustment code as an intermediary element stored in the ROM. This adjustment code acts as a mediator between the functional data and the BIST verification process. When ROM content needs to be updated, only the adjustment code changes while the predetermined signature pattern remains constant, thus avoiding mask redesign costs
Solution Approach 2:
The patent segments the ROM content into two distinct parts: functional data and BIST signature adjustment code. This segmentation allows independent management of each part - functional data can be updated without affecting the BIST verification mechanism, while the adjustment code handles the signature pattern adaptation, thereby reducing manufacturing costs
2Measurement precision
If the predetermined signature pattern is updated to match new ROM content, then the BIST verification accuracy is maintained, but the design complexity and testing requirements increase
Solution Approach 1:
The BIST circuit performs self-verification by automatically generating a signature pattern from the ROM content and comparing it with the predetermined signature pattern. The BIST signature adjustment code enables this self-service mechanism to work correctly without requiring external intervention to update the predetermined pattern, thus maintaining verification accuracy while reducing design complexity
Solution Approach 2:
The patent changes the parameter that needs to be updated from the predetermined signature pattern to the BIST signature adjustment code stored in ROM. This parameter change strategy maintains BIST verification accuracy because the comparison mechanism remains the same, while significantly reducing design complexity since the adjustment code can be freely modified without affecting the fixed predetermined pattern
3Productivity
If the BIST circuit uses a fixed predetermined signature pattern, then the verification process is simple and fast, but any ROM updates require costly mask redesign
Solution Approach 1:
The patent segments ROM content into functional data and BIST signature adjustment code, allowing the verification process to remain simple and fast using the fixed predetermined signature pattern, while simultaneously enabling ROM update flexibility through modification of the adjustment code portion
Solution Approach 2:
The BIST signature adjustment code serves as an intermediary that enables ROM updates without requiring changes to the predetermined signature pattern. This intermediary maintains the simplicity and speed of the verification process while providing the flexibility to update ROM content
Data Source
AI summary
An integrated circuit includes a Built-In Self-Test (BIST) circuit, a predetermined signature pattern and a Read Only Memory (ROM), wherein the predetermined signature pattern is stored in the integrated circuit. The ROM stores at least effective information and a BIST signature adjustment code, the BIST signature adjustment code is irrelevant to any functional information stored in the ROM; wherein the BIST circuit is used to test content stored in the ROM to generate a signature pattern, and compare the signature pattern with the predetermined signature pattern to judge if the content stored in the ROM has error.


